Power-aware Test Generation for Reducing Yield Loss Risk in At-Speed Scan Testing
2006 ◽
Vol E89-D
(5)
◽
pp. 1679-1686
◽
2008 ◽
Vol 24
(4)
◽
pp. 379-391
◽
1987 ◽
Vol 134
(2)
◽
pp. 69
◽
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