23rd IEEE VLSI Test Symposium (VTS'05)
Latest Publications

TOTAL DOCUMENTS

91

(FIVE YEARS 0)

H-INDEX

18

(FIVE YEARS 0)

Published By IEEE

0769523145

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Defect screening using independent component analysis on I/sub DDQ/

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.38 ◽

2005 ◽

Cited By ~ 9

Author(s):

R. Turakhia ◽

B. Benware ◽

R. Madge ◽

T. Shannon ◽

R. Daasch

Keyword(s):

Independent Component Analysis ◽

Component Analysis ◽

Independent Component

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An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.30 ◽

2005 ◽

Cited By ~ 3

Author(s):

Dongwoo Hong ◽

C. Dryden ◽

G. Saksena

Keyword(s):

Measurement Technique ◽

Jitter Measurement ◽

Random Jitter

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Synthesis of Low Power CED Circuits Based on Parity Codes

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.80 ◽

2005 ◽

Cited By ~ 21

Author(s):

S. Ghosh ◽

S. Basu ◽

N.A. Touba

Keyword(s):

Low Power

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Implementing a Scheme for External Deterministic Self-Test

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.50 ◽

2005 ◽

Cited By ~ 3

Author(s):

A.W. Hakmi ◽

H.-J. Wunderlich ◽

V. Gherman ◽

M. Garbers ◽

J. Schloffel

Keyword(s):

Self Test

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Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.58 ◽

2005 ◽

Cited By ~ 18

Author(s):

Qikai Chen ◽

H. Mahmoodi ◽

S. Bhunia ◽

K. Roy

Keyword(s):

Failure Mechanisms ◽

Process Variations ◽

Nanoscale Cmos

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Resistive Bridge fault model evolution from conventional to ultra deep submicron

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.72 ◽

2005 ◽

Cited By ~ 26

Author(s):

I. Polian ◽

P. Engelke ◽

B. Becker ◽

S. Kundu ◽

J.-M. Galliere ◽

...

Keyword(s):

Fault Model ◽

Deep Submicron ◽

Model Evolution

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Defect Tolerance for Gracefully-Degradable Microfluidics-Based Biochips

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.39 ◽

2005 ◽

Cited By ~ 13

Author(s):

Fei Su ◽

K. Chakrabarty

Keyword(s):

Defect Tolerance

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Test and Characterization of a Variable-Capacity Multilevel DRAM

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.82 ◽

2005 ◽

Cited By ~ 4

Author(s):

J.C. Koob ◽

S.A. Ung ◽

A.S. Rao ◽

D.A. Leder ◽

C.S. Joly ◽

...

Keyword(s):

Variable Capacity

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Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.41 ◽

2005 ◽

Cited By ~ 20

Author(s):

Rao Desineni ◽

R.D. Blanton

Keyword(s):

Neighborhood Function

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Segmented Addressable Scan Architecture

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.74 ◽

2005 ◽

Cited By ~ 13

Author(s):

A. Al-Yamani ◽

E. Chmelar ◽

M. Grinchuck

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