On low-capture-power test generation for scan testing

2005 ◽  
Author(s):  
Xiaoqing Wen ◽  
Y. Yamashita ◽  
S. Kajihara ◽  
Laung-Terng Wang ◽  
K.K. Saluja ◽  
...  
Keyword(s):  
Test Generation ◽  
Scan Testing ◽  
Power Test

scholarly journals A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation

2017 ◽  
Vol E100.D (9) ◽  
pp. 2118-2125 ◽  
Author(s):  
Toshinori HOSOKAWA ◽  
Atsushi HIRAI ◽  
Yukari YAMAUCHI ◽  
Masayuki ARAI
Keyword(s):  
Test Generation ◽  
Test Vector ◽  
Power Test

A low capture power test generation method using capture safe test vectors

2015 ◽  
Author(s):  
Atsushi Hirai ◽  
Yukari Yamauchi ◽  
Toshinori Hosokawa ◽  
Masayuki Arai
Keyword(s):  
Test Generation ◽  
Power Test ◽  
Test Vectors

Power-aware test generation with guaranteed launch safety for at-speed scan testing

2011 ◽  
Author(s):  
X. Wen ◽  
K. Enokimoto ◽  
K. Miyase ◽  
Y. Yamato ◽  
M. A. Kochte ◽  
...  
Keyword(s):  
Test Generation ◽  
Scan Testing

Low-capture-power test generation for scan-based at-speed testing

2006 ◽  
Author(s):  
Xiaoqing Wen ◽  
Y. Yamashita ◽  
S. Morishima ◽  
S. Kajihara ◽  
Laung-Terng Wang ◽  
...  
Keyword(s):  
Test Generation ◽  
Power Test

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing

2008 ◽  
Author(s):  
X. Wen ◽  
K. Miyase ◽  
S. Kajihara ◽  
H. Furukawa ◽  
Y. Yamato ◽  
...  
Keyword(s):  
Test Generation ◽  
Scan Testing

A Probabilistic and Constraint Based Approach for Low Power Test Generation

2012 ◽  
Author(s):  
Hossein Sabaghian-Bidgoli ◽  
Majid Namaki-Shoushtari ◽  
Zainalabedin Navabi
Keyword(s):  
Low Power ◽  
Test Generation ◽  
Power Test ◽  
Low Power Test
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