Case Studies on Transition Fault Test Generation for At-speed Scan Testing

2010 ◽  
Author(s):  
Nor Azura Zakaria ◽  
Edward V. Bautista Jr. ◽  
Suhaimi Bahisham Jusoh ◽  
Weng Fook Lee ◽  
Xiaoqing Wen
Keyword(s):  
Case Studies ◽  
Test Generation ◽  
Scan Testing ◽  
Transition Fault

Two case studies in grammar-based test generation

2010 ◽  
Vol 83 (12) ◽  
pp. 2369-2378 ◽  
Author(s):  
Daniel Hoffman ◽  
Hong-Yi Wang ◽  
Mitch Chang ◽  
David Ly-Gagnon ◽  
Lewis Sobotkiewicz ◽  
...  
Keyword(s):  
Case Studies ◽  
Test Generation

Power-aware test generation with guaranteed launch safety for at-speed scan testing

2011 ◽  
Author(s):  
X. Wen ◽  
K. Enokimoto ◽  
K. Miyase ◽  
Y. Yamato ◽  
M. A. Kochte ◽  
...  
Keyword(s):  
Test Generation ◽  
Scan Testing

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing

2008 ◽  
Author(s):  
X. Wen ◽  
K. Miyase ◽  
S. Kajihara ◽  
H. Furukawa ◽  
Y. Yamato ◽  
...  
Keyword(s):  
Test Generation ◽  
Scan Testing

Power-aware Test Generation for Reducing Yield Loss Risk in At-Speed Scan Testing

2019 ◽  
Vol 18 (1) ◽  
pp. 231-236
Author(s):  
Yuta Yamato ◽  
Xiaoqing Wen ◽  
Kohei Miyase ◽  
Hiroshi Furukawa ◽  
Seiji Kajihara
Keyword(s):  
Test Generation ◽  
Yield Loss ◽  
Scan Testing

On low-capture-power test generation for scan testing

2005 ◽  
Author(s):  
Xiaoqing Wen ◽  
Y. Yamashita ◽  
S. Kajihara ◽  
Laung-Terng Wang ◽  
K.K. Saluja ◽  
...  
Keyword(s):  
Test Generation ◽  
Scan Testing ◽  
Power Test

Equivalent Faults under Launch-on-Shift (LOS) Tests with Equal Primary Input Vectors

2021 ◽  
Vol 26 (4) ◽  
pp. 1-15
Author(s):  
Irith Pomeranz
Keyword(s):  
Test Generation ◽  
Fault Simulation ◽  
Single Cycle ◽  
Primary Input ◽  
Test Set ◽  
Efficient Procedure ◽  
Test Compaction ◽  
Transition Faults ◽  
Transition Fault ◽  
Types Of Faults

A recent work showed that it is possible to transform a single-cycle test for stuck-at faults into a launch-on-shift (LOS) test that is guaranteed to detect the same stuck-at faults without any logic or fault simulation. The LOS test also detects transition faults. This was used for obtaining a compact LOS test set that detects both types of faults. In the scenario where LOS tests are used for both stuck-at and transition faults, this article observes that, under certain conditions, the detection of a stuck-at fault guarantees the detection of a corresponding transition fault. This implies that the two faults are equivalent under LOS tests. Equivalence can be used for reducing the set of target faults for test generation and test compaction. The article develops this notion of equivalence under LOS tests with equal primary input vectors and provides an efficient procedure for identifying it. It presents experimental results to demonstrate that such equivalences exist in benchmark circuits, and shows an unexpected effect on a test compaction procedure.

scholarly journals On-chip Generation of Functional Tests with Reduced Delay and Power

2017 ◽  
Vol 6 (1) ◽  
pp. 36-46
Author(s):  
Hemanth Kumar Motamarri ◽  
B. Leela Kumari
Keyword(s):  
Test Generation ◽  
Fault Coverage ◽  
Pattern Generation ◽  
Functional Tests ◽  
Primary Input ◽  
Transition Fault ◽  
High Transition ◽  
On Chip

This paper describes different methods  on-chip test generation method for functional tests. The hardware was based on application of primary input sequences in order to allow the circuit to produce reachable states. Random primary input sequences were modeled to avoid repeated synchronization and thus yields varied sets of reachable states by implementing a decoder in between circuit and LFSR. The on-chip generation of functional tests require simple hardware and achieved high transition fault coverage for testable circuits. Further, power and delay can be reduced by using Bit Swapping LFSR (BS-LFSR). This technique yields less number of transitions for all pattern generation. Bit-swapping (BS) technique is less complex and more reliable to hardware miscommunications.

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