scholarly journals Constant and Switched Bias Low Frequency Noise in p-MOSFETs with Varying Gate Oxide Thickness

2002 ◽  
Author(s):  
J.S. Kolhatkar ◽  
C. Salm ◽  
M.J. Knitel ◽  
H. Wallinga
Keyword(s):  
Low Frequency ◽  
Gate Oxide ◽  
Oxide Thickness ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Oxide Thickness

Low-Frequency Noise Characterization of Ultra-Low Equivalent-Oxide-Thickness Thulium Silicate Interfacial Layer nMOSFETs

2015 ◽  
Vol 36 (12) ◽  
pp. 1355-1358 ◽  
Author(s):  
Maryam Olyaei ◽  
Eugenio Dentoni Litta ◽  
Per-Erik Hellstrom ◽  
Mikael Ostling ◽  
Bengt Gunnar Malm
Keyword(s):  
Interfacial Layer ◽  
Low Frequency ◽  
Oxide Thickness ◽  
Frequency Noise ◽  
Equivalent Oxide Thickness ◽  
Low Frequency Noise ◽  
Noise Characterization

Effects of Gate Oxide and Junction Nonuniformity on the DC and Low-Frequency Noise Performance of Four-Gate Transistors

2012 ◽  
Vol 59 (2) ◽  
pp. 459-467 ◽  
Author(s):  
Juan A. Jiménez Tejada ◽  
A. Luque Rodríguez ◽  
A. Godoy ◽  
S. Rodríguez-Bolívar ◽  
Juan A. López Villanueva ◽  
...  
Keyword(s):  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Noise Performance ◽  
Low Frequency Noise

Study of Gate Oxide/Channel Interface Properties of SON MOSFETs by Random Telegraph Signal and Low Frequency Noise

2011 ◽  
Vol 10 (3) ◽  
pp. 402-408 ◽  
Author(s):  
M'hamed Trabelsi ◽  
Liviu Militaru ◽  
Nabil Sghaier ◽  
Andrea Savio ◽  
Stephane Monfray ◽  
...  
Keyword(s):  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Interface Properties ◽  
Low Frequency Noise ◽  
Random Telegraph Signal

Low Frequency Noise Analysis of Impact of Metal Gate Processing on the Gate Oxide Stack Quality

2018 ◽  
Vol 7 (3) ◽  
pp. Q26-Q32 ◽  
Author(s):  
C. Claeys ◽  
L. He ◽  
B. J. O'Sullivan ◽  
A. Veloso ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Noise Analysis ◽  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate
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