Low Frequency Noise Analysis of Impact of Metal Gate Processing on the Gate Oxide Stack Quality

2018 ◽  
Vol 7 (3) ◽  
pp. Q26-Q32 ◽  
Author(s):  
C. Claeys ◽  
L. He ◽  
B. J. O'Sullivan ◽  
A. Veloso ◽  
N. Horiguchi ◽  
...  
2013 ◽  
Vol 60 (9) ◽  
pp. 2960-2962 ◽  
Author(s):  
Jae Woo Lee ◽  
Eddy Simoen ◽  
Anabela Veloso ◽  
Moon Ju Cho ◽  
Hiroaki Arimura ◽  
...  

2016 ◽  
Vol 115 ◽  
pp. 7-11
Author(s):  
Tsung-Hsien Kao ◽  
Shoou-Jinn Chang ◽  
Yean-Kuen Fang ◽  
Po-Chin Huang ◽  
Bo-Chin Wang ◽  
...  

2021 ◽  
pp. 1-1
Author(s):  
Hao Zhu ◽  
Bin Ye ◽  
Chengkang Tang ◽  
Xianghui Li ◽  
Qingqing Sun ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document