Low frequency noise analysis in HfO[sub 2]∕SiO[sub 2] gate oxide fully depleted silicon on insulator transistors
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2013 ◽
Vol 2
(11)
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pp. Q205-Q210
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2018 ◽
Vol 7
(3)
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pp. Q26-Q32
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2013 ◽
Vol 60
(3)
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pp. 1272-1275
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2002 ◽
Vol 41
(Part 1, No. 3A)
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pp. 1279-1283
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2002 ◽
Vol 46
(12)
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pp. 2281-2285
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1995 ◽
pp. 247-252
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