Low frequency noise analysis in HfO[sub 2]∕SiO[sub 2] gate oxide fully depleted silicon on insulator transistors

Author(s):  
L. Zafari ◽  
J. Jomaah ◽  
G. Ghibaudo ◽  
O. Faynot
2013 ◽  
Vol 2 (11) ◽  
pp. Q205-Q210 ◽  
Author(s):  
E. Simoen ◽  
M. Aoulaiche ◽  
S. D. dos Santos ◽  
J. A. Martino ◽  
V. Strobel ◽  
...  

2013 ◽  
Vol 53 (5) ◽  
pp. 49-61 ◽  
Author(s):  
E. R. Simoen ◽  
M. Aoulaiche ◽  
S. D. dos Santos ◽  
J. A. Martino ◽  
V. Strobel ◽  
...  

2018 ◽  
Vol 7 (3) ◽  
pp. Q26-Q32 ◽  
Author(s):  
C. Claeys ◽  
L. He ◽  
B. J. O'Sullivan ◽  
A. Veloso ◽  
N. Horiguchi ◽  
...  

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