Effects of Gate Oxide and Junction Nonuniformity on the DC and Low-Frequency Noise Performance of Four-Gate Transistors
2012 ◽
Vol 59
(2)
◽
pp. 459-467
◽
2003 ◽
Vol 24
(9)
◽
pp. 535-537
◽
2005 ◽
Vol 152
(9)
◽
pp. F115
◽
Keyword(s):
InAsSb-basednBnphotodetectors: lattice mismatched growth on GaAs and low-frequency noise performance
2015 ◽
Vol 30
(10)
◽
pp. 105011
◽
Keyword(s):