Channel soft breakdown enhanced excess low-frequency noise in ultra-thin gate oxide PD analog SOI devices

2005 ◽  
Author(s):  
S. Chiang ◽  
M.C. Chen ◽  
W.S. Liao ◽  
J.M. You ◽  
M.F. Lu ◽  
...  
Keyword(s):  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Soi Devices ◽  
Thin Gate Oxide ◽  
Soft Breakdown

Low frequency noise in thin gate oxide MOSFETs

2001 ◽  
Vol 41 (4) ◽  
pp. 579-585 ◽  
Author(s):  
R. Kolarova ◽  
T. Skotnicki ◽  
J.A. Chroboczek
Keyword(s):  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Thin Gate Oxide

Effects of Gate Oxide and Junction Nonuniformity on the DC and Low-Frequency Noise Performance of Four-Gate Transistors

2012 ◽  
Vol 59 (2) ◽  
pp. 459-467 ◽  
Author(s):  
Juan A. Jiménez Tejada ◽  
A. Luque Rodríguez ◽  
A. Godoy ◽  
S. Rodríguez-Bolívar ◽  
Juan A. López Villanueva ◽  
...  
Keyword(s):  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Noise Performance ◽  
Low Frequency Noise

Study of Gate Oxide/Channel Interface Properties of SON MOSFETs by Random Telegraph Signal and Low Frequency Noise

2011 ◽  
Vol 10 (3) ◽  
pp. 402-408 ◽  
Author(s):  
M'hamed Trabelsi ◽  
Liviu Militaru ◽  
Nabil Sghaier ◽  
Andrea Savio ◽  
Stephane Monfray ◽  
...  
Keyword(s):  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Interface Properties ◽  
Low Frequency Noise ◽  
Random Telegraph Signal

Low Frequency Noise Analysis of Impact of Metal Gate Processing on the Gate Oxide Stack Quality

2018 ◽  
Vol 7 (3) ◽  
pp. Q26-Q32 ◽  
Author(s):  
C. Claeys ◽  
L. He ◽  
B. J. O'Sullivan ◽  
A. Veloso ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Noise Analysis ◽  
Low Frequency ◽  
Gate Oxide ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate
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