scholarly journals Electrical characteristics of amorphous indium‐tin‐gallium‐zinc‐oxide TFTs under positive gate bias stress

2020 ◽  
Vol 56 (2) ◽  
pp. 102-104 ◽  
Author(s):  
D. Kim ◽  
K. Cho ◽  
S. Woo ◽  
S. Kim
Keyword(s):  
Zinc Oxide ◽  
Gate Bias ◽  
Electrical Characteristics ◽  
Bias Stress ◽  
Oxide Tfts ◽  
Gate Bias Stress

Effects of negative gate-bias stress on the performance of solution-processed zinc-oxide transistors

2014 ◽  
Vol 65 (3) ◽  
pp. 330-335
Author(s):  
Dongwook Kim ◽  
Woo-Sub Lee ◽  
Hyunji Shin ◽  
Jong Sun Choi ◽  
Xue Zhang ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Gate Bias ◽  
Solution Processed ◽  
Bias Stress ◽  
Gate Bias Stress

Effects of Gate Bias Stress on the Electrical Characteristics of ZnO Thin Film Transistor

2008 ◽  
Vol 53 (1) ◽  
pp. 412-415 ◽  
Author(s):  
Jae-Hong Jeon ◽  
Hee-Hwan Choe ◽  
Kang-Woong Lee ◽  
Jae-Heon Shin ◽  
Chi-Sun Hwang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Zno Thin Film ◽  
Gate Bias ◽  
Electrical Characteristics ◽  
Bias Stress ◽  
Gate Bias Stress

P-6.1: Asymmetric Effects of Gate-Bias Stress Voltage on the Stability under Positive and Negative Gate-Bias Stress of a-IGZO TFTs

2018 ◽  
Vol 49 ◽  
pp. 597-600
Author(s):  
Xiaoliang Zhou ◽  
Xiaodong Zhang ◽  
Yang Shao ◽  
Letao Zhang ◽  
Hongyu He ◽  
...  
Keyword(s):  
Gate Bias ◽  
Asymmetric Effects ◽  
Bias Stress ◽  
The Stability ◽  
Stress Voltage ◽  
Gate Bias Stress

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

2011 ◽  
Vol 99 (2) ◽  
pp. 022104 ◽  
Author(s):  
Te-Chih Chen ◽  
Ting-Chang Chang ◽  
Tien-Yu Hsieh ◽  
Wei-Siang Lu ◽  
Fu-Yen Jian ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Charge Trapping ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Trapping Effect ◽  
Gate Bias Stress
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