Gate bias-stress induced hump-effect in transfer characteristics of amorphous-indium-galium-zinc-oxide thin-fim transistors with various channel widths

2011 ◽  
Vol 99 (12) ◽  
pp. 122107 ◽  
Author(s):  
Mallory Mativenga ◽  
Manju Seok ◽  
Jin Jang
Keyword(s):  
Zinc Oxide ◽  
Gate Bias ◽  
Bias Stress ◽  
Transfer Characteristics ◽  
Gate Bias Stress

Effects of negative gate-bias stress on the performance of solution-processed zinc-oxide transistors

2014 ◽  
Vol 65 (3) ◽  
pp. 330-335
Author(s):  
Dongwook Kim ◽  
Woo-Sub Lee ◽  
Hyunji Shin ◽  
Jong Sun Choi ◽  
Xue Zhang ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Gate Bias ◽  
Solution Processed ◽  
Bias Stress ◽  
Gate Bias Stress

State creation under gate-bias stress in polysilicon TFTs studied from the temperature-transfer characteristics behavior

2003 ◽  
Vol 427 (1-2) ◽  
pp. 340-344
Author(s):  
H. Toutah ◽  
J.F. Llibre ◽  
B. Tala-Ighil ◽  
B. Boudart ◽  
T. Mohammed-Brahim
Keyword(s):  
Gate Bias ◽  
Bias Stress ◽  
Transfer Characteristics ◽  
Gate Bias Stress ◽  
State Creation

P-6.1: Asymmetric Effects of Gate-Bias Stress Voltage on the Stability under Positive and Negative Gate-Bias Stress of a-IGZO TFTs

2018 ◽  
Vol 49 ◽  
pp. 597-600
Author(s):  
Xiaoliang Zhou ◽  
Xiaodong Zhang ◽  
Yang Shao ◽  
Letao Zhang ◽  
Hongyu He ◽  
...  
Keyword(s):  
Gate Bias ◽  
Asymmetric Effects ◽  
Bias Stress ◽  
The Stability ◽  
Stress Voltage ◽  
Gate Bias Stress

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

2011 ◽  
Vol 99 (2) ◽  
pp. 022104 ◽  
Author(s):  
Te-Chih Chen ◽  
Ting-Chang Chang ◽  
Tien-Yu Hsieh ◽  
Wei-Siang Lu ◽  
Fu-Yen Jian ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Charge Trapping ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Trapping Effect ◽  
Gate Bias Stress

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress

2017 ◽  
Vol 32 (2) ◽  
pp. 91-96
Author(s):  
张猛 ZHANG Meng ◽  
夏之荷 XIA Zhi-he ◽  
周玮 ZHOU Wei ◽  
陈荣盛 CHEN Rong-sheng ◽  
王文 WONG Man ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress
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