Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress
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2016 ◽
Vol 55
(2S)
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pp. 02BC17
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2011 ◽
Vol 44
(45)
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pp. 455102
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2019 ◽
Vol 19
(4)
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pp. 2179-2182
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2008 ◽
Vol 29
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pp. 1309-1311
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2010 ◽
Vol 87
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pp. 2019-2023
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