26th IEEE VLSI Test Symposium (vts 2008)
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26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.63 ◽

2008 ◽

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Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.24 ◽

2008 ◽

Cited By ~ 6

Author(s):

Rajarajan Senguttuvan ◽

Soumendu Bhattacharya ◽

Abhijit Chatterjee

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Multiple Coupling Effects Oriented Path Delay Test Generation

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.9 ◽

2008 ◽

Cited By ~ 2

Author(s):

Minjin Zhang ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Test Generation ◽

Path Delay ◽

Delay Test ◽

Coupling Effects ◽

Oriented Path ◽

Path Delay Test

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Signature Rollback - A Technique for Testing Robust Circuits

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.34 ◽

2008 ◽

Cited By ~ 4

Author(s):

Uranmandakh Amgalan ◽

Christian Hachmann ◽

Sybille Hellebrand ◽

Hans-Joachim Wunderlich

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An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.17 ◽

2008 ◽

Author(s):

A. Ney ◽

P. Girard ◽

S. Pravossoudovitch ◽

A. Virazel ◽

M. Bastian ◽

...

Keyword(s):

Voltage Sensing ◽

Sram Design

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Synthesis for Broadside Testability of Transition Faults

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.10 ◽

2008 ◽

Cited By ~ 2

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Transition Faults

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An Industrial Case Study of Sticky Path-Delay Faults

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.44 ◽

2008 ◽

Cited By ~ 1

Author(s):

I-De Huang ◽

Yi-Shing Chang ◽

Sandeep K. Gupta ◽

Sreejit Chakravarty

Keyword(s):

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Industrial Case Study

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[Copyright notice]

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.3 ◽

2008 ◽

Keyword(s):

Copyright Notice

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A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.37 ◽

2008 ◽

Cited By ~ 6

Author(s):

K. Christou ◽

M.K. Michael ◽

P. Bernardi ◽

M. Grosso ◽

E. Sanchez ◽

...

Keyword(s):

Delay Faults ◽

Path Delay ◽

Path Delay Faults ◽

Generation Technique

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Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.42 ◽

2008 ◽

Cited By ~ 16

Author(s):

Ritesh Garg ◽

Richard Putman ◽

Nur A. Touba

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