Signature Rollback - A Technique for Testing Robust Circuits

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.34 ◽

2008 ◽

Cited By ~ 4

Author(s):

Uranmandakh Amgalan ◽

Christian Hachmann ◽

Sybille Hellebrand ◽

Hans-Joachim Wunderlich

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