Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.24 ◽

2008 ◽

Cited By ~ 6

Author(s):

Rajarajan Senguttuvan ◽

Soumendu Bhattacharya ◽

Abhijit Chatterjee

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