Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.42 ◽

2008 ◽

Cited By ~ 16

Author(s):

Ritesh Garg ◽

Richard Putman ◽

Nur A. Touba

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