Optical characterization of ferroelectric PZT thin films by variable angle spectroscopic ellipsometry

2014 ◽  
Author(s):  
Md. Shafiqur Rahman ◽  
Carlos D. Garcia ◽  
Amar Bhalla ◽  
Ruyan Guo
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Pzt Thin Films ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical Characterization of Silicon Oxynitride Thin Films by Variable Angle Spectroscopic Ellipsometry

1992 ◽  
Vol 18 (2) ◽  
pp. 124-128 ◽  
Author(s):  
Yi-Ming Xiong ◽  
Paul G. Snyder ◽  
John A. Woollam ◽  
G. A. Al-Jumaily ◽  
F. J. Gagliardi ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization ◽  
Silicon Oxynitride ◽  
Variable Angle ◽  
Variable Angle Spectroscopic Ellipsometry

Optical characterization of sol–gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions

2005 ◽  
Vol 244 (1-4) ◽  
pp. 338-342 ◽  
Author(s):  
Daniel Franta ◽  
Ivan Ohlídal ◽  
Jan Mistrík ◽  
Tomuo Yamaguchi ◽  
Gu Jin Hu ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Sol Gel ◽  
Optical Characterization ◽  
Pzt Thin Films

Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization
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