Optical characterization of sol–gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions

2005 ◽  
Vol 244 (1-4) ◽  
pp. 338-342 ◽  
Author(s):  
Daniel Franta ◽  
Ivan Ohlídal ◽  
Jan Mistrík ◽  
Tomuo Yamaguchi ◽  
Gu Jin Hu ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Sol Gel ◽  
Optical Characterization ◽  
Pzt Thin Films

Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization

Sol–gel synthesis and optical characterization of nano-crystalline ZnTiO3 thin films

2012 ◽  
Vol 41 (1) ◽  
pp. 60-64 ◽  
Author(s):  
M. Vishwas ◽  
K. Narasimha Rao ◽  
A. R. Phani ◽  
K. V. Arjuna Gowda
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Optical Characterization ◽  
Nano Crystalline ◽  
Sol Gel Synthesis

Spectroscopic ellipsometry characterization of Er3+-dopedtitania thin films prepared by the sol-gel method

Optik ◽  
2001 ◽  
Vol 112 (7) ◽  
pp. 316-320 ◽  
Author(s):  
R. Palomino-Merino ◽  
A. Mendoza-Galván ◽  
G. Martínez ◽  
V. Castaño ◽  
R. Rodríguez
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Sol Gel ◽  
Gel Method ◽  
Sol Gel Method

Optical characterization of sol–gel derived Nb2O5 thin films

2014 ◽  
Vol 58 ◽  
pp. 114-118 ◽  
Author(s):  
K. Lazarova ◽  
M. Vasileva ◽  
G. Marinov ◽  
T. Babeva
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Optical Characterization
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