Optical characterization of CuIn1−xGaxSe2 alloy thin films by spectroscopic ellipsometry

2003 ◽  
Vol 94 (2) ◽  
pp. 879-888 ◽  
Author(s):  
P. D. Paulson ◽  
R. W. Birkmire ◽  
W. N. Shafarman
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Characterization

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

2016 ◽  
Vol 851 ◽  
pp. 199-204 ◽  
Author(s):  
Veronika Schmiedova ◽  
Jan Pospisil ◽  
Oldrich Zmeskal ◽  
Viliam Vretenar
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Graphene Oxide ◽  
Spectroscopic Ellipsometry ◽  
Inkjet Printing ◽  
Optical Characterization ◽  
Thermal Reduction ◽  
Visible Range ◽  
Dispersion Function

The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.

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