Demonstration of low cost TSV fabrication in thick silicon wafers

Author(s):  
E. Vick ◽  
D. S. Temple ◽  
R. Anderson ◽  
J. Lannon ◽  
C. Li ◽  
...  
Keyword(s):  
Low Cost ◽  
2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Ryosuke Watanabe ◽  
Yohei Eguchi ◽  
Takuya Yamada ◽  
Yoji Saito

Antireflection coating (ARC) prepared by a wet process is beneficial for low cost fabrication of photovoltaic cells. In this study, we investigated optical properties and morphologies of spin-coated TiO2ARCs on alkaline textured single-crystalline silicon wafers. Reflectance spectra of the spin-coated ARCs on alkaline textured silicon wafers exhibit no interferences and low reflectance values in the entire visible range. We modeled the structures of the spin-coated films for ray tracing numerical calculation and compared numerically calculated reflectance spectra with the experimental results. This is the first report to clarify the novel optical properties experimentally and theoretically. Optical properties of the spin-coated ARCs without interference are due to the fractional nonuniformity of the thickness of the spin-coated ARCs that cancels out the interference of the incident light.


1988 ◽  
Vol 65 (6) ◽  
pp. 1131-1136
Author(s):  
ANDREI SILARD ◽  
GABRIEL NANI

Author(s):  
Z. J. Pei ◽  
Alan Strasbaugh

In order to ensure high quality chips with high yield, the base material, semiconductor wafers (over 90% are silicon), must have superior quality. It is critically important to develop new manufacturing processes that allow silicon wafer manufacturers to produce high quality wafers at a reasonably low cost. A newly patented technology—fine grinding of etched silicon wafers—has great potential to manufacture very flat silicon wafers more cost-effectively. This paper presents an investigation of grinding marks in fine grinding. The investigation covers (1) nature of grinding marks, (2) factors that have effects on grinding marks, and (3) approaches to reduce grinding marks. Varying chuck speed during grinding operation is shown to be a very effective approach to reduce grinding marks. Conclusions from this study have direct impacts to the silicon wafer industry.


2011 ◽  
Vol 121-126 ◽  
pp. 805-809
Author(s):  
P.S Pa

In this study, the design of the mechanism of a recycling system using composite electrochemical and chemical machining for removing the surface layers from silicon wafers of solar cells is studied. The reason for constructing a new engineering technology and developing a clean production approach to perform the removal of surface thin film layers from silicon wafers is to develop a mass production system for recycling defective or discarded silicon wafers of solar cells that can reduce pollution. The goal of the development is to replace the current approach, which uses strong acid and grinding and may cause damage to the physical structure of silicon wafers and cause pollution to the environment, to efficiently meet the requirements of industry for low cost. It can not only perform highly efficient recycling of silicon wafers from discarded solar cells to facilitate the following remelting and crystal pulling process, but can also recycle defective silicon wafers during the fabrication process of solar cells for rework. A small gap width between cathode and workpiece, higher temperature, higher concentration, or higher flow rate of machining fluid corresponds to a higher removal rate for Si3N4 layer and epoxy film. Pulsed direct current can improve the effect of dregs discharge and is advantageous to associate with the fast feed rate of workpiece, but raises the current rating. A higher feed rate of silicon wafers of solar cells combine with enough electric power produces fast machining performance. The electrochemical and chemical machining just needs quite short time to make the Si3N4 layer and epoxy film remove easily and cleanly. An effective and low-cost recycle process for silicon wafers of solar cells is presented.


1988 ◽  
Vol 9 (1) ◽  
pp. 20-22
Author(s):  
A. Silard ◽  
G. Nani

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