Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

2011 ◽  
Author(s):  
Dong Xiang ◽  
Zhen Chen
Keyword(s):  
Low Power ◽  
Test Data ◽  
Scan Testing ◽  
Test Response ◽  
Response Collection

Test Response of a Turbocharger Supported on Floating Ring Bearings: Part I — Assessment of Subsynchronous Motions

2003 ◽  
Author(s):  
Chris Holt ◽  
Luis San Andre´s ◽  
Sunil Sahay ◽  
Peter Tang ◽  
Gerry La Rue ◽  
...  
Keyword(s):  
Ambient Temperature ◽  
Test Data ◽  
Natural Frequencies ◽  
Comprehensive Analysis ◽  
Experimental Results ◽  
Inlet Pressure ◽  
Rotor Speed ◽  
Test Response ◽  
Feed Pressure ◽  
Feed Temperature

Measurements of casing acceleration on an automotive turbocharger running to a top speed of 115 krpm and driven by ambient temperature pressurized air are reported. Waterfall acceleration spectra versus rotor speed show the effects of increasing lubricant inlet pressure and temperature on the turbocharger rotordynamic response. A comprehensive analysis of the test data forwards regimes of speed operation with two subsynchronous whirl motions (rotordynamic instabilities). Increasing the lubricant feed pressure delays the onset speed of instability for the most severe subsynchronous motion. However, increasing the lubricant feed pressure also produces larger synchronous displacements. The effect of lubricant feed temperature is minimal on the onset and end speeds of rotordynamic instability. Nevertheless, operation with a cold lubricant exhibits lower amplitudes of motion, synchronous and subsynchronous. The experimental results show the subsynchronous frequencies of motion do not lock (whip) at system natural frequencies but continuously track the rotor speed. No instabilities (subsynchronous whirl) remain for operating speeds above 90 krpm. Bearings greatly influence turbocharger (TC) rotordynamic performance.

A Compression Improvement Technique for Low-Power Scan Test Data

2006 ◽  
Author(s):  
Jaehoon Song ◽  
Hyunbean Yi ◽  
Doochan Hwang ◽  
Sungju Park
Keyword(s):  
Low Power ◽  
Test Data ◽  
Scan Test

A gated clock scheme for low power scan testing of logic ICs or embedded cores

2002 ◽  
Author(s):  
Y. Bonhomme ◽  
P. Girard ◽  
L. Guiller ◽  
C. Landrault ◽  
S. Pravossoudovitch
Keyword(s):  
Low Power ◽  
Scan Testing ◽  
Embedded Cores ◽  
Gated Clock
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