Proceedings 10th Asian Test Symposium
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TOTAL DOCUMENTS

81

(FIVE YEARS 0)

H-INDEX

13

(FIVE YEARS 0)

Published By IEEE

0769513786

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Faulty resistance sectioning technique for resistive bridging fault ATPG systems

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990263 ◽

2002 ◽

Cited By ~ 13

Author(s):

T. Shinogi ◽

T. Kanbayashi ◽

T. Yoshikawa ◽

S. Tsuruoka ◽

T. Hayashi

Keyword(s):

Bridging Fault

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An RT-level ATPG based on clustering of circuit states

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990284 ◽

2002 ◽

Author(s):

Huawei Li ◽

Yinghua Min ◽

Zhongcheng Li

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TX7901 DFT

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990328 ◽

2002 ◽

Author(s):

T. Kamada

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An approach to RTL fault extraction and test generation

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990285 ◽

2002 ◽

Author(s):

Zhigang Yin ◽

Yinghua Min ◽

Xiaowei Li

Keyword(s):

Test Generation

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Short circuit faults in state-of-the-art ADCs - are they hard or soft?

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990319 ◽

2002 ◽

Cited By ~ 1

Author(s):

A. Lechner ◽

A. Richardson ◽

B. Hermes

Keyword(s):

State Of The Art ◽

Short Circuit

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A new code-disjoint sum-bit duplicated carry look-ahead adder for parity codes

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990310 ◽

2002 ◽

Cited By ~ 11

Author(s):

E.S. Sogomonyan ◽

V. Ocheretnij ◽

M. Gossel

Keyword(s):

Look Ahead

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A DFT method for core-based systems-on-a-chip based on consecutive testability

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990280 ◽

2002 ◽

Cited By ~ 4

Author(s):

T. Yoneda ◽

H. Fujiwara

Keyword(s):

Dft Method

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Automatic test generation for analog circuits using compact test transfer function models

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990317 ◽

2002 ◽

Cited By ~ 2

Author(s):

B. Sahu ◽

A. Chatterjee

Keyword(s):

Transfer Function ◽

Analog Circuits ◽

Test Generation ◽

Automatic Test Generation ◽

Automatic Test ◽

Function Models ◽

Transfer Function Models ◽

Compact Test

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Selecting a PRPG: randomness, primitiveness, or sheer luck?

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990311 ◽

2002 ◽

Cited By ~ 1

Author(s):

I. Bayraktaroglu ◽

A. Orailoglu

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I/sub DDQ/ sensing technique for high speed IDDQ testing

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990268 ◽

2002 ◽

Cited By ~ 3

Author(s):

T. Takeda ◽

M. Hashizume ◽

M. Ichimiya ◽

H. Yotsuyanagi ◽

Y. Miura ◽

...

Keyword(s):

High Speed ◽

Iddq Testing

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