scholarly journals Low Power Test-Compression for High Test-Quality and Low Test-Data Volume

2011 ◽  
Author(s):  
Vasileios Tenentes ◽  
Xrysovalantis Kavousianos
Keyword(s):  
Low Power ◽  
Test Data ◽  
Test Quality ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
Data Volume ◽  
High Test

Low Power Test Compression with Programmable Broadcast-Based Control

2014 ◽  
Author(s):  
Sylwester Milewski ◽  
Grzegorz Mrugalski ◽  
Janusz Rajski ◽  
Jerzy Tyszer
Keyword(s):  
Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test

Low-Power Test Data Application in EDT Environment Through Decompressor Freeze

2008 ◽  
Vol 27 (7) ◽  
pp. 1278-1290 ◽  
Author(s):  
Dariusz Czysz ◽  
Grzegorz Mrugalski ◽  
Janusz Rajski ◽  
Jerzy Tyszer
Keyword(s):  
Low Power ◽  
Test Data ◽  
Power Test ◽  
Data Application ◽  
Low Power Test

scholarly journals Development of Low Power Test Data Compression Techniques for Digital VLSI Circuits

IJARCCE ◽  
2016 ◽  
Vol 5 (12) ◽  
pp. 423-425 ◽  
Author(s):  
Mr. Mohammad Iliyas ◽  
Mrs. Farha Anjum ◽  
Dr. Anil Kumar Sharma ◽  
Dr. R. Murali Prasad
Keyword(s):  
Low Power ◽  
Data Compression ◽  
Test Data ◽  
Vlsi Circuits ◽  
Test Data Compression ◽  
Power Test ◽  
Digital Vlsi ◽  
Low Power Test

LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs

2018 ◽  
Vol 34 (6) ◽  
pp. 685-695 ◽  
Author(s):  
Haiying Yuan ◽  
Changshi Zhou ◽  
Xun Sun ◽  
Kai Zhang ◽  
Tong Zheng ◽  
...  
Keyword(s):  
Low Power ◽  
Power Test ◽  
Test Compression ◽  
Low Power Test ◽  
Lfsr Reseeding

Access-in-turn test architecture for low-power test application

2016 ◽  
Vol 104 (3) ◽  
pp. 433-441 ◽  
Author(s):  
Weizheng Wang ◽  
JinCheng Wang ◽  
Zengyun Wang ◽  
Lingyun Xiang
Keyword(s):  
Low Power ◽  
Power Test ◽  
Low Power Test ◽  
Test Application ◽  
Test Architecture
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