A comparative study of the light-induced defects in intrinsic amorphous and microcrystalline silicon deposited by remote plasma enhanced chemical vapor deposition
2000 ◽
Vol 266-269
◽
pp. 385-390
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1998 ◽
Vol 145
(8)
◽
pp. 2900-2904
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1991 ◽
Vol 9
(3)
◽
pp. 444-449
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Keyword(s):
2007 ◽
Vol 38
(1-2)
◽
pp. 148-151
◽
1987 ◽
Vol 5
(4)
◽
pp. 1903-1904
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