Kink effect on subthreshold current conduction mechanism for n‐channel metal‐oxide‐silicon devices

1996 ◽  
Vol 80 (10) ◽  
pp. 5821-5827 ◽  
Author(s):  
S. S. Chen ◽  
S. C. Lin ◽  
J. B. Kuo
Keyword(s):  
Metal Oxide ◽  
Conduction Mechanism ◽  
Subthreshold Current ◽  
Silicon Devices ◽  
Kink Effect ◽  
Current Conduction ◽  
Metal Oxide Silicon

Negative bias-temperature instabilities in metal–oxide–silicon devices with SiO2 and SiOxNy/HfO2 gate dielectrics

2004 ◽  
Vol 84 (22) ◽  
pp. 4394-4396 ◽  
Author(s):  
X. J. Zhou ◽  
L. Tsetseris ◽  
S. N. Rashkeev ◽  
D. M. Fleetwood ◽  
R. D. Schrimpf ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Gate Dielectrics ◽  
Negative Bias ◽  
Silicon Devices ◽  
Metal Oxide Silicon ◽  
Bias Temperature Instabilities
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