Effect of Al-trace dimension on Joule heating and current crowding in flip-chip solder joints under accelerated electromigration
Keyword(s):
2009 ◽
Vol 38
(12)
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pp. 2443-2448
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2007 ◽
Vol 12
(5)
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pp. 423-430
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Keyword(s):
Keyword(s):
Keyword(s):
2006 ◽
Vol 46
(8)
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pp. 1357-1368
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