Parametric modeling and measurement of silicon etching in a high density chlorine plasma

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Vol 65 (4) ◽  
pp. 478-480 ◽  
Author(s):  
D. Dane ◽  
T. D. Mantei
2005 ◽  
Vol 14 (2) ◽  
pp. S42-S52 ◽  
Author(s):  
G Cunge ◽  
M Kogelschatz ◽  
O Joubert ◽  
N Sadeghi

2001 ◽  
Vol 19 (5) ◽  
pp. 2197-2206 ◽  
Author(s):  
Steven A. Vitale ◽  
Heeyeop Chae ◽  
Herbert H. Sawin
Keyword(s):  

2019 ◽  
Vol 33 (12) ◽  
pp. 1-21 ◽  
Author(s):  
Lionel Cadix ◽  
Christine Fuchs ◽  
Maxime Rousseau ◽  
Patrick Leduc ◽  
Hamed Chaabouni ◽  
...  

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