Characterization of the field-effect conductivity distribution in pentacene thin-film transistors by a near-field scanning microwave microscope

2011 ◽  
Vol 161 (11-12) ◽  
pp. 931-936 ◽  
Author(s):  
Arsen Babajanyan ◽  
Harutyun Melikyan ◽  
Jerome Carnis ◽  
Youngwoon Yoon ◽  
Hanju Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Field Effect ◽  
Near Field ◽  
Conductivity Distribution ◽  
Microwave Microscope ◽  
Near Field Scanning

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics

2012 ◽  
Vol 83 (8) ◽  
pp. 083702 ◽  
Author(s):  
J. C. Weber ◽  
J. B. Schlager ◽  
N. A. Sanford ◽  
A. Imtiaz ◽  
T. M. Wallis ◽  
...  
Keyword(s):  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Characterization of magnetoresistance hysteresis of Permalloy thin-film using near-field microwave microscope

2010 ◽  
Vol 519 (1) ◽  
pp. 399-403
Author(s):  
Harutyun Melikyan ◽  
Arsen Babajanyan ◽  
Neun Jong Lee ◽  
Tae Hee Kim ◽  
Hanju Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Near Field ◽  
Microwave Microscope

Fabrication and characterization of C60 thin-film transistors with high field-effect mobility

2003 ◽  
Vol 82 (25) ◽  
pp. 4581-4583 ◽  
Author(s):  
S. Kobayashi ◽  
T. Takenobu ◽  
S. Mori ◽  
A. Fujiwara ◽  
Y. Iwasa
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Field Effect ◽  
High Field ◽  
Field Effect Mobility ◽  
Fabrication And Characterization
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