Characterization of magnetoresistance hysteresis of Permalloy thin-film using near-field microwave microscope

2010 ◽  
Vol 519 (1) ◽  
pp. 399-403
Author(s):  
Harutyun Melikyan ◽  
Arsen Babajanyan ◽  
Neun Jong Lee ◽  
Tae Hee Kim ◽  
Hanju Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Near Field ◽  
Microwave Microscope

Characterization of the field-effect conductivity distribution in pentacene thin-film transistors by a near-field scanning microwave microscope

2011 ◽  
Vol 161 (11-12) ◽  
pp. 931-936 ◽  
Author(s):  
Arsen Babajanyan ◽  
Harutyun Melikyan ◽  
Jerome Carnis ◽  
Youngwoon Yoon ◽  
Hanju Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Field Effect ◽  
Near Field ◽  
Conductivity Distribution ◽  
Microwave Microscope ◽  
Near Field Scanning

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7−δ thin film by the low-temperature scanning microwave microscope

2006 ◽  
Vol 252 (7) ◽  
pp. 2615-2621 ◽  
Author(s):  
Sohei Okazaki ◽  
Noriaki Okazaki ◽  
Xiaoru Zhao ◽  
Hidetaka Sugaya ◽  
Sei-ichiro Yaginuma ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
High Throughput ◽  
Microwave Microscope ◽  
Local Conductivity ◽  
Temperature Scanning

Near-field optical characterization of interacting and non-interacting gold nanoparticles embedded in a silica thin film

2011 ◽  
Vol 284 (12) ◽  
pp. 3118-3123
Author(s):  
Loic Lalouat ◽  
Laurent Billot ◽  
Lionel Aigouy ◽  
Francesco Pineider ◽  
César de Julián Fernández ◽  
...  
Keyword(s):  
Thin Film ◽  
Gold Nanoparticles ◽  
Near Field ◽  
Optical Characterization ◽  
Silica Thin Film

Recursive Image Charge Approach for Quantitative Characterization of Dielectric Thin Film Library Using Scanning Tip Microwave Near-field Microscopy

2003 ◽  
Vol 804 ◽  
Author(s):  
Chen Gao ◽  
Bo Hu ◽  
Mengming Huang ◽  
Pu Zhang ◽  
Wen-han Liu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Dielectric Constant ◽  
Near Field ◽  
Image Charge ◽  
Film Library ◽  
Quantitative Characterization ◽  
Dielectric Thin Films ◽  
Dielectric Thin Film

ABSTRACTWe developed a recursive image charge approach for quantitative characterizations of dielectric thin films using the scanning tip microwave near-field microscope. With this method, frequency shift of the microscope as functions of the dielectric constant and the thickness of a film can be effectively computed in a recursive way. We believe that this approach can promote the high-throughput characterization of the dielectric libraries.

A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics

2012 ◽  
Vol 83 (8) ◽  
pp. 083702 ◽  
Author(s):  
J. C. Weber ◽  
J. B. Schlager ◽  
N. A. Sanford ◽  
A. Imtiaz ◽  
T. M. Wallis ◽  
...  
Keyword(s):  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning
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