Theoretical and experimental characterization of a near-field scanning microwave microscope (NSMM)

2003 ◽  
Vol 51 (1) ◽  
pp. 91-99 ◽  
Author(s):  
I.I.I. Symons WC ◽  
K.W. Whites ◽  
R.A. Lodder
Keyword(s):  
Near Field ◽  
Experimental Characterization ◽  
Microwave Microscope ◽  
Near Field Scanning

A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics

2012 ◽  
Vol 83 (8) ◽  
pp. 083702 ◽  
Author(s):  
J. C. Weber ◽  
J. B. Schlager ◽  
N. A. Sanford ◽  
A. Imtiaz ◽  
T. M. Wallis ◽  
...  
Keyword(s):  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Characterization of the field-effect conductivity distribution in pentacene thin-film transistors by a near-field scanning microwave microscope

2011 ◽  
Vol 161 (11-12) ◽  
pp. 931-936 ◽  
Author(s):  
Arsen Babajanyan ◽  
Harutyun Melikyan ◽  
Jerome Carnis ◽  
Youngwoon Yoon ◽  
Hanju Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Field Effect ◽  
Near Field ◽  
Conductivity Distribution ◽  
Microwave Microscope ◽  
Near Field Scanning

scholarly journals Demonstration of an integrated nanophotonic chip-scale alkali vapor magnetometer using inverse design

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Yoel Sebbag ◽  
Eliran Talker ◽  
Alex Naiman ◽  
Yefim Barash ◽  
Uriel Levy
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Computer Assisted ◽  
Experimental Characterization ◽  
Optical Isolation ◽  
New Concepts ◽  
On Chip ◽  
The Cost ◽  
Micrometer Scale

AbstractRecently, there has been growing interest in the miniaturization and integration of atomic-based quantum technologies. In addition to the obvious advantages brought by such integration in facilitating mass production, reducing the footprint, and reducing the cost, the flexibility offered by on-chip integration enables the development of new concepts and capabilities. In particular, recent advanced techniques based on computer-assisted optimization algorithms enable the development of newly engineered photonic structures with unconventional functionalities. Taking this concept further, we hereby demonstrate the design, fabrication, and experimental characterization of an integrated nanophotonic-atomic chip magnetometer based on alkali vapor with a micrometer-scale spatial resolution and a magnetic sensitivity of 700 pT/√Hz. The presented platform paves the way for future applications using integrated photonic–atomic chips, including high-spatial-resolution magnetometry, near-field vectorial imaging, magnetically induced switching, and optical isolation.

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

Investigation of photoconductivity of silicon solar cells by a near-field scanning microwave microscope

2009 ◽  
Vol 109 (8) ◽  
pp. 958-962 ◽  
Author(s):  
Jongchel Kim ◽  
Arsen Babajanyan ◽  
Tigran Sargsyan ◽  
Harutyun Melikyan ◽  
Seungwan Kim ◽  
...  
Keyword(s):  
Solar Cells ◽  
Near Field ◽  
Silicon Solar Cells ◽  
Microwave Microscope ◽  
Near Field Scanning
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