A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET

2008 ◽  
Vol 48 (4) ◽  
pp. 504-507 ◽  
Author(s):  
M.Z. Dai ◽  
S.I. Kim ◽  
Andrew Yap ◽  
Shaohua Liu ◽  
Arthur Cheng ◽  
...  
Keyword(s):  
High Voltage ◽  
Interface State ◽  
Hole Injection ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection ◽  
State Generation

Effect of Gate Materials on Generation of Interface State by Hot-Carrier Injection

1993 ◽  
Vol 32 (Part 1, No. 1B) ◽  
pp. 362-367 ◽  
Author(s):  
Hideaki Matsuhashi ◽  
Satoshi Nishikawa
Keyword(s):  
Interface State ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection

Impact of Lateral Nonuniform Doping and Hot Carrier Injection on Capacitance Behavior of High Voltage MOSFETs

2008 ◽  
Vol 25 (5) ◽  
pp. 244 ◽  
Author(s):  
YogeshSingh Chauhan ◽  
Renaud Gillon ◽  
Michel Declercq ◽  
AdrianMihai Ionescu
Keyword(s):  
High Voltage ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection
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