Effect of Gate Materials on Generation of Interface State by Hot-Carrier Injection

Hideaki Matsuhashi; Satoshi Nishikawa

doi:10.1143/jjap.32.362

Effect of Gate Materials on Generation of Interface State by Hot-Carrier Injection

Japanese Journal of Applied Physics ◽

10.1143/jjap.32.362 ◽

1993 ◽

Vol 32 (Part 1, No. 1B) ◽

pp. 362-367 ◽

Cited By ~ 4

Author(s):

Hideaki Matsuhashi ◽

Satoshi Nishikawa

Keyword(s):

Interface State ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Physical model of drain conductance, g/sub d/, degradation of NMOSFET's due to interface state generation by hot carrier injection

IEEE Transactions on Electron Devices ◽

10.1109/16.293309 ◽

1994 ◽

Vol 41 (6) ◽

pp. 964-969 ◽

Cited By ~ 26

Author(s):

I. Kurachi ◽

Nam Hwang ◽

L. Forbes

Keyword(s):

Physical Model ◽

Interface State ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

State Generation ◽

Drain Conductance

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A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection

Microelectronics Reliability ◽

10.1016/j.microrel.2010.08.023 ◽

2011 ◽

Vol 51 (2) ◽

pp. 337-341 ◽

Cited By ~ 7

Author(s):

Chenyue Ma ◽

Lining Zhang ◽

Chenfei Zhang ◽

Xiufang Zhang ◽

Jin He ◽

...

Keyword(s):

Interface State ◽

Performance Degradation ◽

Carrier Injection ◽

State Distribution ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Distribution Effect

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A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET

Microelectronics Reliability ◽

10.1016/j.microrel.2007.09.007 ◽

2008 ◽

Vol 48 (4) ◽

pp. 504-507 ◽

Cited By ~ 1

Author(s):

M.Z. Dai ◽

S.I. Kim ◽

Andrew Yap ◽

Shaohua Liu ◽

Arthur Cheng ◽

...

Keyword(s):

High Voltage ◽

Interface State ◽

Hole Injection ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

State Generation

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Effect of Gate Materials on Generation of Interface State by Hot-Carrier Injection

10.7567/ssdm.1992.a-3-4 ◽

1992 ◽

Author(s):

H. Matsuhashi ◽

S. Nishikawa

Keyword(s):

Interface State ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Analysis of Hot Carrier Injection According to Gate Length

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2019.17102 ◽

2019 ◽

Vol 19 (10) ◽

pp. 6746-6749 ◽

Cited By ~ 1

Author(s):

Taejin Jang ◽

Myung-Hyun Baek ◽

Min-Woo Kwon ◽

Sungmin Hwang ◽

Jeesoo Chang ◽

...

Keyword(s):

Gate Length ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement

IEEE Journal of Solid-State Circuits ◽

10.1109/jssc.2020.3035207 ◽

2020 ◽

pp. 1-1

Author(s):

Kunyang Liu ◽

Xinpeng Chen ◽

Hongliang Pu ◽

Hirofumi Shinohara

Keyword(s):

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Effects of Different Gate Stress Conditions on Hot Carrier Injection in High Voltage N-Channel CMOS

2021 China Semiconductor Technology International Conference (CSTIC) ◽

10.1109/cstic52283.2021.9461476 ◽

2021 ◽

Author(s):

Lei Li ◽

Sarah Zhou ◽

Kelly Yang

Keyword(s):

High Voltage ◽

Stress Conditions ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Plasmon-Triggered Upconversion Emissions and Hot Carrier Injection for Combinatorial Photothermal and Photodynamic Cancer Therapy

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c21949 ◽

2021 ◽

Author(s):

Subin Yu ◽

Dohyub Jang ◽

Hong Yuan ◽

Wen-Tse Huang ◽

Minju Kim ◽

...

Keyword(s):

Cancer Therapy ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Photodynamic Cancer Therapy ◽

Upconversion Emissions

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Hot Carrier Injection Phenomenon due to Excessive Natural Local Self-Boosting Effect in 3D NAND Flash Memory

10.7567/ssdm.2019.ps-2-07 ◽

2019 ◽

Author(s):

Y. Jeong ◽

I. Ham ◽

S.J. Baik ◽

M. Kang

Keyword(s):

Flash Memory ◽

Nand Flash ◽

Carrier Injection ◽

Nand Flash Memory ◽

Hot Carrier ◽

Hot Carrier Injection

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Evidence of acceptor-like oxide defects created by hot-carrier injection in n-MOSFET's: a charge-pumping study

IEEE Electron Device Letters ◽

10.1109/55.75703 ◽

1991 ◽

Vol 12 (2) ◽

pp. 60-62 ◽

Cited By ~ 26

Author(s):

D. Vuillaume ◽

J.C. Marchetaux ◽

A. Boudou

Keyword(s):

Carrier Injection ◽

Charge Pumping ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Oxide Defects ◽

A Charge

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