Physical model of drain conductance, g/sub d/, degradation of NMOSFET's due to interface state generation by hot carrier injection

1994 ◽  
Vol 41 (6) ◽  
pp. 964-969 ◽  
Author(s):  
I. Kurachi ◽  
Nam Hwang ◽  
L. Forbes
Keyword(s):  
Physical Model ◽  
Interface State ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection ◽  
State Generation ◽  
Drain Conductance

Effect of Gate Materials on Generation of Interface State by Hot-Carrier Injection

1993 ◽  
Vol 32 (Part 1, No. 1B) ◽  
pp. 362-367 ◽  
Author(s):  
Hideaki Matsuhashi ◽  
Satoshi Nishikawa
Keyword(s):  
Interface State ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection

Analysis of Hot Carrier Injection According to Gate Length

2019 ◽  
Vol 19 (10) ◽  
pp. 6746-6749 ◽  
Author(s):  
Taejin Jang ◽  
Myung-Hyun Baek ◽  
Min-Woo Kwon ◽  
Sungmin Hwang ◽  
Jeesoo Chang ◽  
...  
Keyword(s):  
Gate Length ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection

scholarly journals Investigation of the Impact of Hot-Carrier-Induced Interface State Generation on Carrier Mobility in nMOSFET

2021 ◽  
pp. 1-8
Author(s):  
Zhicheng Wu ◽  
Jacopo Franco ◽  
Brecht Truijen ◽  
Philippe Roussel ◽  
Ben Kaczer ◽  
...  
Keyword(s):  
Carrier Mobility ◽  
Interface State ◽  
Hot Carrier ◽  
State Generation ◽  
The Impact
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