A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection

2011 ◽  
Vol 51 (2) ◽  
pp. 337-341 ◽  
Author(s):  
Chenyue Ma ◽  
Lining Zhang ◽  
Chenfei Zhang ◽  
Xiufang Zhang ◽  
Jin He ◽  
...  
Keyword(s):  
Interface State ◽  
Performance Degradation ◽  
Carrier Injection ◽  
State Distribution ◽  
Hot Carrier ◽  
Hot Carrier Injection ◽  
Distribution Effect

Effect of Gate Materials on Generation of Interface State by Hot-Carrier Injection

1993 ◽  
Vol 32 (Part 1, No. 1B) ◽  
pp. 362-367 ◽  
Author(s):  
Hideaki Matsuhashi ◽  
Satoshi Nishikawa
Keyword(s):  
Interface State ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection

Analysis of Hot Carrier Injection According to Gate Length

2019 ◽  
Vol 19 (10) ◽  
pp. 6746-6749 ◽  
Author(s):  
Taejin Jang ◽  
Myung-Hyun Baek ◽  
Min-Woo Kwon ◽  
Sungmin Hwang ◽  
Jeesoo Chang ◽  
...  
Keyword(s):  
Gate Length ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection
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