Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics
2007 ◽
Vol 47
(12)
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pp. 2109-2113
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2006 ◽
Vol 53
(4)
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pp. 823-828
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2004 ◽
Vol 48
(12)
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pp. 2271-2275
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2007 ◽
Vol 84
(9-10)
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pp. 2230-2234
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2006 ◽
Vol 53
(4)
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pp. 836-843
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2001 ◽
Vol 41
(9-10)
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pp. 1361-1366
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2011 ◽
Vol 32
(8)
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pp. 1083-1085
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2020 ◽
Vol 67
(1)
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pp. 245-252
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