Comprehensive study on low-frequency noise and mobility in Si and SiGe pMOSFETs with high-/spl kappa/ gate dielectrics and TiN gate

2006 ◽  
Vol 53 (4) ◽  
pp. 836-843 ◽  
Author(s):  
M. von Haartman ◽  
B.G. Malm ◽  
Mikael Ostling
Keyword(s):  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Comprehensive Study

Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics

2006 ◽  
Vol 53 (4) ◽  
pp. 823-828 ◽  
Author(s):  
Gino Giusi ◽  
F. Crupi ◽  
C. Pace ◽  
C. Ciofi ◽  
G. Groeseneken
Keyword(s):  
Comparative Study ◽  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Comprehensive Study on the Relation Between Low-Frequency Noise and Asymmetric Parasitic Resistances in a Vertical Pillar-Type FET

2017 ◽  
Vol 38 (8) ◽  
pp. 1008-1011
Author(s):  
Seung-Wook Lee ◽  
Tewook Bang ◽  
Choong-Ki Kim ◽  
Kyu-Man Hwang ◽  
Byung Chul Jang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Comprehensive Study

Low-frequency noise in Si0.7Ge0.3 surface channel pMOSFETs with ALD HfO2/Al2O3 gate dielectrics

2004 ◽  
Vol 48 (12) ◽  
pp. 2271-2275 ◽  
Author(s):  
M. von Haartman ◽  
D. Wu ◽  
B.G. Malm ◽  
P.-E. Hellström ◽  
S.-L. Zhang ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Characterization of electrically active defects in high-k gate dielectrics by using low frequency noise and charge pumping measurements

2007 ◽  
Vol 84 (9-10) ◽  
pp. 2230-2234 ◽  
Author(s):  
H.D. Xiong ◽  
D. Heh ◽  
M. Gurfinkel ◽  
Q. Li ◽  
Y. Shapira ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Charge Pumping ◽  
High K

scholarly journals Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

2014 ◽  
Vol 97 ◽  
pp. 14-22 ◽  
Author(s):  
S.D. dos Santos ◽  
B. Cretu ◽  
V. Strobel ◽  
J.-M. Routoure ◽  
R. Carin ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Assessment

Low frequency noise and reliability properties pf 0.12 μm CMOS devices with Ta2O5 as gate dielectrics

2001 ◽  
Vol 41 (9-10) ◽  
pp. 1361-1366 ◽  
Author(s):  
M. Fadlallah ◽  
A. Szewczyk ◽  
C. Giannakopoulos ◽  
B. Cretu ◽  
F. Monsieur ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics

2007 ◽  
Vol 47 (12) ◽  
pp. 2109-2113 ◽  
Author(s):  
P. Magnone ◽  
C. Pace ◽  
F. Crupi ◽  
G. Giusi
Keyword(s):  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise
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