A quantum mechanical treatment of low frequency noise in high-K NMOS transistors with ultra-thin gate dielectrics

2012 ◽  
Vol 78 ◽  
pp. 131-135 ◽  
Author(s):  
Xiaochen Zhang ◽  
Marvin H. White
Keyword(s):  
Mechanical Treatment ◽  
Gate Dielectrics ◽  
Low Frequency ◽  
Quantum Mechanical ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Quantum Mechanical Treatment ◽  
High K ◽  
Nmos Transistors

Characterization of electrically active defects in high-k gate dielectrics by using low frequency noise and charge pumping measurements

2007 ◽  
Vol 84 (9-10) ◽  
pp. 2230-2234 ◽  
Author(s):  
H.D. Xiong ◽  
D. Heh ◽  
M. Gurfinkel ◽  
Q. Li ◽  
Y. Shapira ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Charge Pumping ◽  
High K

Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation

2016 ◽  
Vol 115 ◽  
pp. 7-11
Author(s):  
Tsung-Hsien Kao ◽  
Shoou-Jinn Chang ◽  
Yean-Kuen Fang ◽  
Po-Chin Huang ◽  
Bo-Chin Wang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K ◽  
Technology Process ◽  
28 Nm

Improving Low-Frequency Noise in 14-nm FinFET by Optimized High-k/Metal Gate Thermal Processing

2021 ◽  
pp. 1-1
Author(s):  
Hao Zhu ◽  
Bin Ye ◽  
Chengkang Tang ◽  
Xianghui Li ◽  
Qingqing Sun ◽  
...  
Keyword(s):  
Thermal Processing ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K

scholarly journals Low-Frequency Noise Assessment of Work Function Engineering Cap Layers in High-k Gate Stacks

2019 ◽  
Vol 8 (2) ◽  
pp. N25-N31 ◽  
Author(s):  
C. Claeys ◽  
R. Ritzenthaler ◽  
T. Schram ◽  
H. Arimura ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Work Function ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Stacks ◽  
High K ◽  
Noise Assessment

Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors

2011 ◽  
Vol 58 (8) ◽  
pp. 2310-2316 ◽  
Author(s):  
Diana Lopez ◽  
S. Haendler ◽  
C. Leyris ◽  
Gregory Bidal ◽  
Gérard Ghibaudo
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Variability Analysis ◽  
Cmos Transistors ◽  
High K

Impact of Trap Behavior in High-k/Metal Gate p-MOSFET with Incorporated Fluorine on Low-Frequency Noise Characteristics

2014 ◽  
Author(s):  
T.–H. Kao ◽  
S.–L. Wu ◽  
C.–Y. Wu ◽  
Y.–K. Fang ◽  
P.–C. Huang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Noise Characteristics ◽  
High K

scholarly journals Low-frequency noise in high-k LaLuO3/TiN MOSFETs

2012 ◽  
Vol 78 ◽  
pp. 51-55 ◽  
Author(s):  
Maryam Olyaei ◽  
B. Gunnar Malm ◽  
Per-Erik Hellström ◽  
Mikael Östling
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
High K
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