Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics
2006 ◽
Vol 53
(4)
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pp. 823-828
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2009 ◽
Vol 30
(8)
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pp. 828-830
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2012 ◽
Vol 33
(4)
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pp. 555-557
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2004 ◽
Vol 48
(12)
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pp. 2271-2275
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2005 ◽
Vol 49
(8)
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pp. 1352-1360
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2007 ◽
Vol 84
(9-10)
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pp. 2230-2234
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2006 ◽
Vol 53
(4)
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pp. 836-843
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1994 ◽
Vol 194-196
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pp. 89-90
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