Threshold Voltage Instability and Low Frequency Noise in Hafnium-Based Gate Dielectrics
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2010 ◽
Vol 23
(7)
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pp. 545-549
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2004 ◽
Vol 25
(4)
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pp. 211-213
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2006 ◽
Vol 53
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pp. 823-828
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2004 ◽
Vol 48
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pp. 2271-2275
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2007 ◽
Vol 84
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pp. 2230-2234
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2006 ◽
Vol 53
(4)
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pp. 836-843
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2001 ◽
Vol 41
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pp. 1361-1366
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