Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications

2013 ◽  
Vol 45 (13) ◽  
pp. 1859-1868 ◽  
Author(s):  
Peter J. Cumpson ◽  
Jose F. Portoles ◽  
Anders J. Barlow ◽  
Naoko Sano ◽  
Mark Birch
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Yield Data ◽  
Argon Gas ◽  
Cluster Ion Beams ◽  
In Vitro Diagnostic ◽  
Cluster Ion ◽  
Sputter Yield

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Argon Gas ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams

2012 ◽  
Vol 116 (44) ◽  
pp. 23735-23741 ◽  
Author(s):  
Li Yang ◽  
Martin P. Seah ◽  
Ian S. Gilmore
Keyword(s):  
Ion Beams ◽  
Argon Gas ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Sputtering Yields

scholarly journals Improved mass resolution and mass accuracy in TOF-SIMS spectra and images using argon gas cluster ion beams

2016 ◽  
Vol 11 (2) ◽  
pp. 02A321 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Sohee Yoon ◽  
Jeong Hee Moon ◽  
Tae Geol Lee
Keyword(s):  
Mass Accuracy ◽  
Ion Beams ◽  
Mass Resolution ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion

The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 221-224 ◽  
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Incident Energy ◽  
Depth Profiling ◽  
Ion Beams ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Dual beam depth profiling of polymer materials: comparison of C60and Ar cluster ion beams for sputtering

2012 ◽  
Vol 45 (1) ◽  
pp. 171-174 ◽  
Author(s):  
D. Rading ◽  
R. Moellers ◽  
H.-G. Cramer ◽  
E. Niehuis
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Polymer Materials ◽  
Dual Beam ◽  
Beam Depth ◽  
Cluster Ion Beams ◽  
Cluster Ion

Depth profiling analysis of damaged arginine films with Ar cluster ion beams

2012 ◽  
Vol 44 (6) ◽  
pp. 729-731 ◽  
Author(s):  
J. Matsuo ◽  
K. Ichiki ◽  
Y. Yamamoto ◽  
T. Seki ◽  
T. Aoki
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Profiling Analysis

TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

2011 ◽  
Vol 83 (10) ◽  
pp. 3793-3800 ◽  
Author(s):  
Sadia Rabbani ◽  
Andrew M. Barber ◽  
John S. Fletcher ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Ion Beams ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion
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