Dual beam depth profiling of polymer materials: comparison of C60and Ar cluster ion beams for sputtering

2012 ◽  
Vol 45 (1) ◽  
pp. 171-174 ◽  
Author(s):  
D. Rading ◽  
R. Moellers ◽  
H.-G. Cramer ◽  
E. Niehuis
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Polymer Materials ◽  
Dual Beam ◽  
Beam Depth ◽  
Cluster Ion Beams ◽  
Cluster Ion

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

2009 ◽  
Vol 23 (11) ◽  
pp. 1601-1606 ◽  
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Ion Beams ◽  
Polymer Materials ◽  
Ion Mass Spectrometry ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Secondary Ion

scholarly journals Dual beam organic depth profiling using large argon cluster ion beams

2014 ◽  
Vol 46 (10-11) ◽  
pp. 936-939 ◽  
Author(s):  
M. Holzweber ◽  
A. G. Shard ◽  
H. Jungnickel ◽  
A. Luch ◽  
W. E. S. Unger
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Dual Beam ◽  
Cluster Ion Beams ◽  
Cluster Ion

The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 221-224 ◽  
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Incident Energy ◽  
Depth Profiling ◽  
Ion Beams ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Argon Gas ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Depth profiling analysis of damaged arginine films with Ar cluster ion beams

2012 ◽  
Vol 44 (6) ◽  
pp. 729-731 ◽  
Author(s):  
J. Matsuo ◽  
K. Ichiki ◽  
Y. Yamamoto ◽  
T. Seki ◽  
T. Aoki
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Profiling Analysis

Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

2018 ◽  
Vol 11 (1) ◽  
pp. 29-48 ◽  
Author(s):  
Nicholas Winograd
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Ion Beams ◽  
High Yield ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Secondary Ion

Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of clusters containing thousands of particles, initiate desorption of target molecules with high yield and minimal fragmentation. This review emphasizes the unique opportunities for implementing these sources, especially for bioimaging applications. Theoretical aspects of the cluster ion/solid interaction are developed to maximize conditions for successful mass spectrometry. In addition, the history of how GCIBs have become practical laboratory tools is reviewed. Special emphasis is placed on the versatility of these sources, as size, kinetic energy, and chemical composition can be varied easily to maximize lateral resolution, hopefully to less than 1 micron, and to maximize ionization efficiency. Recent examples of bioimaging applications are also presented.

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

2012 ◽  
Vol 84 (18) ◽  
pp. 7865-7873 ◽  
Author(s):  
Alexander G. Shard ◽  
Rasmus Havelund ◽  
Martin P. Seah ◽  
Steve J. Spencer ◽  
Ian S. Gilmore ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Interlaboratory Study ◽  
Cluster Ion Beams ◽  
Cluster Ion
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