Molecular Depth Profiling with Argon Gas Cluster Ion Beams

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Argon Gas ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 221-224 ◽  
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Incident Energy ◽  
Depth Profiling ◽  
Ion Beams ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry

2018 ◽  
Vol 11 (1) ◽  
pp. 29-48 ◽  
Author(s):  
Nicholas Winograd
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Profiling ◽  
Ion Beams ◽  
High Yield ◽  
Ion Mass Spectrometry ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Secondary Ion

Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of clusters containing thousands of particles, initiate desorption of target molecules with high yield and minimal fragmentation. This review emphasizes the unique opportunities for implementing these sources, especially for bioimaging applications. Theoretical aspects of the cluster ion/solid interaction are developed to maximize conditions for successful mass spectrometry. In addition, the history of how GCIBs have become practical laboratory tools is reviewed. Special emphasis is placed on the versatility of these sources, as size, kinetic energy, and chemical composition can be varied easily to maximize lateral resolution, hopefully to less than 1 micron, and to maximize ionization efficiency. Recent examples of bioimaging applications are also presented.

Molecular Depth Profiling with Cluster Ion Beams

2006 ◽  
Vol 110 (16) ◽  
pp. 8329-8336 ◽  
Author(s):  
Juan Cheng ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

scholarly journals Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams

2008 ◽  
Vol 80 (14) ◽  
pp. 5293-5301 ◽  
Author(s):  
Joseph Kozole ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Energy Deposition ◽  
Depth Profiling ◽  
Ion Beams ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams

2012 ◽  
Vol 116 (44) ◽  
pp. 23735-23741 ◽  
Author(s):  
Li Yang ◽  
Martin P. Seah ◽  
Ian S. Gilmore
Keyword(s):  
Ion Beams ◽  
Argon Gas ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Sputtering Yields
Sign in / Sign up

Export Citation Format

Share Document