scholarly journals Improved mass resolution and mass accuracy in TOF-SIMS spectra and images using argon gas cluster ion beams

2016 ◽  
Vol 11 (2) ◽  
pp. 02A321 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Sohee Yoon ◽  
Jeong Hee Moon ◽  
Tae Geol Lee
Keyword(s):  
Mass Accuracy ◽  
Ion Beams ◽  
Mass Resolution ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion

TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

2011 ◽  
Vol 83 (10) ◽  
pp. 3793-3800 ◽  
Author(s):  
Sadia Rabbani ◽  
Andrew M. Barber ◽  
John S. Fletcher ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Ion Beams ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion

Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams

2012 ◽  
Vol 116 (44) ◽  
pp. 23735-23741 ◽  
Author(s):  
Li Yang ◽  
Martin P. Seah ◽  
Ian S. Gilmore
Keyword(s):  
Ion Beams ◽  
Argon Gas ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Sputtering Yields

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Argon Gas ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

ToF-SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beams

2014 ◽  
Vol 46 (S1) ◽  
pp. 189-192 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Young-Lai Cho ◽  
Choung Su Lim ◽  
Joon Sig Choi ◽  
Sang J. Chung ◽  
...  
Keyword(s):  
Ion Beams ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion ◽  
Diadenosine Triphosphate ◽  
Sims Analysis

scholarly journals Large Molecular Cluster Formation from Liquid Materials and Its Application to ToF-SIMS

2021 ◽  
Vol 5 (2) ◽  
pp. 10
Author(s):  
Kousuke Moritani ◽  
Shogo Nagata ◽  
Atsushi Tanaka ◽  
Kosuke Goto ◽  
Norio Inui
Keyword(s):  
Aspartic Acid ◽  
Ion Beam ◽  
Cluster Formation ◽  
Chemical Properties ◽  
Ion Beams ◽  
Chemical Effect ◽  
Molecular Cluster ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion

Since molecular cluster ion beams are expected to have various chemical effects, they are promising candidates for improving the secondary ion yield of Tof-SIMS. However, in order to clarify the effect and its mechanism, it is necessary to generate molecular cluster ion beams with various chemical properties and systematically examine it. In this study, we have established a method to stably form various molecular cluster ion beams from relatively small amounts of liquid materials for a long time by the bubbling method. Furthermore, we applied the cluster ion beams of water, methanol, methane, and benzene to the primary beam of SIMS and compared the molecular ion yields of aspartic acid. The effect of enhancing the yields of [M+H]+ ion of aspartic acid was found to be the largest for the water cluster and small for the methane and benzene clusters. These results indicate that the chemical effect contributes to the desorption/ionization process of organic molecules by the molecular cluster ion beam.

Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams

2010 ◽  
Vol 42 (9) ◽  
pp. 1453-1457 ◽  
Author(s):  
Takuya Miyayama ◽  
Noriaki Sanada ◽  
Scott R. Bryan ◽  
John S. Hammond ◽  
Mineharu Suzuki
Keyword(s):  
Ion Beams ◽  
Argon Gas ◽  
Cluster Ion Beams ◽  
Cluster Ion

ToF-SIMS imaging with cluster ion beams

2004 ◽  
Vol 231-232 ◽  
pp. 159-163 ◽  
Author(s):  
J. Xu ◽  
S. Ostrowski ◽  
C. Szakal ◽  
A.G. Ewing ◽  
N. Winograd
Keyword(s):  
Ion Beams ◽  
Tof Sims ◽  
Cluster Ion Beams ◽  
Cluster Ion
Sign in / Sign up

Export Citation Format

Share Document