Tribomechanical Properties of Ion-Beam-Densified Sol-Gel Zirconia Thin Films on Cubic Zirconia

1993 ◽  
Vol 308 ◽  
Author(s):  
Timothy E. Levine ◽  
Peter Revesz ◽  
James W. Mayer ◽  
Emmanuel P. Giannelis
Keyword(s):  
Rutherford Backscattering Spectrometry ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Sol Gel ◽  
Recoil Energy ◽  
Subsequent Decrease ◽  
Friction Measurements ◽  
Sol Gel Films ◽  
Carbon Losses ◽  
Tribomechanical Properties

ABSTRACTWe have investigated the tribomechanical properties of ion-beam-densified sol-gel zirconia overlayers on bulk zirconia. Ion irradiation of the sol-gel films leads to hydrogen, oxygen, and carbon losses as indicated by Rutherford backscattering spectrometry and forward recoil energy spectroscopy. Ellipsometry measurements show that the film thickness decreases with increasing dose. The microhardness exhibits an increase and subsequent decrease with dose. Friction measurements along with profilometry measurements indicate that severe abrasive wear of the film takes place in the first 1000 cycles after which point the substrate is in direct contact with the pin.

scholarly journals Ion-Irradiation-Induced Densification of Zirconia Sol -Gel Thin Films

1993 ◽  
Vol 316 ◽  
Author(s):  
Timothy E. Levine ◽  
Emmanuel P. Giannelis ◽  
Padma Kodali ◽  
Joseph Tesmer ◽  
Michael Nastasi ◽  
...  
Keyword(s):  
Nuclear Energy ◽  
Energy Deposition ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Irradiation ◽  
Sol Gel ◽  
Electronic Energy ◽  
Target Atom ◽  
Recoil Energy ◽  
Ion Energies ◽  
Sol Gel Films

ABSTRACTWe have investigated the densification behavior of sol-gel zirconia films resulting from ion irradiation. Three sets of films were implanted with neon, krypton, or xenon. The ion energies were chosen to yield approximately constant energy loss through the film and the doses were chosen to yield similar nuclear energy deposition. Ion irradiation of the sol-gel films resulted in carbon and hydrogen loss as indicated by Rutherford backscattering spectrometry and forward recoil energy spectroscopy. Although the densification was hypothesized to result from target atom displacement, the observed densification exhibits a stronger dependence on electronic energy deposition.

Shape deformation of colloidal titania nanoparticles by means of ion irradiation

2008 ◽  
Vol 1087 ◽  
Author(s):  
Juan-Carlos Cheang-Wong ◽  
Ana-Lilia Díaz-Fonseca
Keyword(s):  
Ion Irradiation ◽  
Ion Beam ◽  
Sol Gel ◽  
Sample Surface ◽  
Electronic Energy ◽  
Titania Nanoparticles ◽  
Direction Parallel ◽  
Titanium Butoxide ◽  
Before And After ◽  
Spherical Silica Particles

AbstractSpherical submicrometer-sized titanium dioxide (TiO2 or titania) particles were prepared by the sol-gel method from hydrolysis and condensation of titanium butoxide Ti(OC4H9)4 using ammonia as a catalyst in ethanol/acetonitrile and annealing in air at 100°C. Subsequently, they were deposited onto silicon substrates, in order to form a monolayer of TiO2 particles. Then these samples were irradiated at room temperature with Si2+ ions at 4, 6 and 8 MeV, with fluences in the 2×1014-2×1015 Si/cm2 range, under an angle of 45° with respect to the sample surface. The titania particles were characterized by scanning electron microscopy to determine their size and shape before and after the ion irradiation. After the Si irradiation the spherical silica particles turned into ellipsoidal particles, as a result of the increase of the particle dimension perpendicular to the ion beam and the decrease in the direction parallel to the ion beam. This deformation effect increases monotonically with the ion fluence, and depends on the electronic energy loss of the impinging ion.

scholarly journals Enhancement of Ammonia Sensitivity in Swift Heavy Ion Irradiated NanocrystallineSnO2Thin Films

2008 ◽  
Vol 2008 ◽  
pp. 1-4 ◽  
Author(s):  
Sanju Rani ◽  
Somnath C. Roy ◽  
N. K. Puri ◽  
M. C. Bhatnagar ◽  
D. Kanjilal
Keyword(s):  
Thin Films ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Energy Levels ◽  
Sol Gel ◽  
Heavy Ion ◽  
High Energy ◽  
Electronic Energy ◽  
Response Characteristics ◽  
Swift Heavy Ion

Swift heavy ion irradiation is an effective technique to induce changes in the microstructure and electronic energy levels of materials leading to significant modification of properties. Here we report enhancement of ammonia (NH3) sensitivity ofSnO2thin films subjected to high-energyNi+ion irradiation. Sol-gel-derivedSnO2thin films (100 nm thickness) were exposed to 75 MeVNi+ion irradiation, and the gas response characteristics of irradiated films were studied as a function of ion fluence. The irradiated films showedp-type conductivity with a much higher response toNH3compared to other gases such as ethanol. The observed enhancement ofNH3sensitivity is discussed in context of ion beam generated electronic states in theSnO2thin films.

Study of Elemental Depth Distribution in the Multilayer Material \(\text{TiO}_2\)/\(\text{SiO}_2\)/Si by Rutherford Backscattering Spectrometry (RBS)

2019 ◽  
Vol 29 (3SI) ◽  
pp. 393
Author(s):  
T. V. Phuc ◽  
M. Kulik ◽  
A. P. Kobzev ◽  
L. H. Khiem
Keyword(s):  
Rutherford Backscattering Spectrometry ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Rutherford Backscattering ◽  
Multilayer Structures ◽  
Multilayer Material ◽  
Transition Layers ◽  
Before And After ◽  
Elemental Depth ◽  
Irradiation Process

In this study we investigated depth distributions of elements in the multilayer structures of TiO\(_2\)/SiO\(_2\)/Si before and after ion irradiation. The samples were implanted with Ne\(^+\), Ar\(^+\), Kr\(^+\) and Xe\(^+\) ions. For each implantation the multilayer structures were irradiated by the ions with the energy 100, 150, 200 and 250 keV. The elemental concentrations in the samples were analyzed by the Rutherford Backscattering Spectrometry (RBS) method. It was found that the transition layers existed between the TiO\(_2\) and SiO\(_2\) layers. Formation of these layers derived from the ion beam mixing that was occurred at TiO\(_2\)/SiO\(_2\) interface after irradiation process. The depth profiles show that thickness of the transition layers increased with the growing energy and atomic mass of the implanted ions.

scholarly journals Interdiffusion and Grain-Boundary Migration in Au/Cu Bilayers During Ion-Irradiation

1991 ◽  
Vol 235 ◽  
Author(s):  
Dale E. Alexander ◽  
L. E. Rehn ◽  
Peter M. Baldo
Keyword(s):  
Grain Boundary ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Irradiation ◽  
Boundary Migration ◽  
Ion Beam ◽  
Film Surface ◽  
Grain Boundary Migration ◽  
Bilayer Films ◽  
Small Probe ◽  
Annealing Experiments

ABSTRACTIon irradiation and annealing experiments have been conducted on Au/Cu bilayer films to evaluate the effect of irradiation on diffusion-induced grain boundary migration (DIGM). The Au films were prepared with a large-grained microstructure with grain boundaries perpendicular to the film surface and extending through the film thickness. Irradiations were conducted with 1.5 MeV Kr at 228°C. Rutherford backscattering spectrometry of the samples revealed that interdiffusion was substantially enhanced in the irradiated area relative to the unirradiated area. Both irradiated and annealed-only areas were characterized by a nearly uniform composition of 14 at.% and 7 at.% Cu respectively through the entire thickness of the underlying Au film. Small probe X-ray energy dispersive spectroscopy showed significant lateral compositional homogeneities in both irradiated and annealed areas. These two results are consistent with previous observations of DIGM in the Au/Cu system, suggesting that this previously unexamined interdiffusion mechanism contributes to ion beam mixing.

Comparison Between Ion-Beam and Thermal-Annealing Induced Solid Phase Epitaxy in Fe-Implanted Si

1993 ◽  
Vol 320 ◽  
Author(s):  
X.W. Lin ◽  
J. Desimoni ◽  
H. Bernas ◽  
Z. Liliental-Weber ◽  
J. Washburn
Keyword(s):  
Electron Microscopy ◽  
Thermal Annealing ◽  
Rutherford Backscattering Spectrometry ◽  
Solid Phase ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Solid Phase Epitaxy ◽  
Thermally Induced ◽  
Transmission Electron ◽  
Visible Effect

Rutherford backscattering spectrometry and transmission electron microscopy were used to compare thermally induced solid phase epitaxy (SPE) with ion-beam induced epitaxial crystallization (IBIEC) of Fe-implanted Si (001). It was found that thermal annealing leads to both Si SPE and β-FeSi2 precipitation at 520°C, but has no visible effect at 320°C. In contrast, Si SPE and FeSi2 precipitation occur at both 320 and 520°C, when ion irradiation is introduced. The precipitates grow epitaxially as γ-FeSi2 at 320°C, but consist of both β-FeSi2 and γ-FeSi2 at 520°C. It was also found that thermal annealing at 520°C results in Fe segregation toward the surface, while IBIEC basically retains the as-implanted Fe profile.

Ion Mixing of Pulsed Laser Deposited Hydroxylapatite (HA)

1994 ◽  
Vol 354 ◽  
Author(s):  
T.L. Alford ◽  
S.W. Russell ◽  
V.B. Pizzicont ◽  
J.W. Mayer ◽  
T.E. Levine ◽  
...  
Keyword(s):  
Rutherford Backscattering Spectrometry ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Pulsed Laser ◽  
Quantitative Measure ◽  
Atomic Displacement ◽  
Mixing Rate ◽  
Bioactive Materials ◽  
Before And After ◽  
Modification Technique

AbstractThe use of ion-beam techniques to enhance selected properties of bioactive materials, such as the adhesion of hydroxylapatite (HA) coatings on titanium-based substrates has been investigated. In this study, very thin HA films on titanium substrates were created by pulsed laser deposition techniques. Ion irradiations were carried out using 260-keV argon ions, with fluences of 0.25-50×1015ions/cm2, and at room temperature. Rutherford backscattering spectrometry was used to evaluate sample composition before and after irradiation. The amount of mixing was quantified by the mixing rate (the amount of atomic displacement due to an irradiation fiuence). This pilot data indicates that mixing was evident after sufficient ion irradiation. The ramification of this preliminary study has provided a quantitative measure of ion mixing as a potential prosthetic biomaterial surface modification technique.

Ion Beam Mixing of Au-Ti

1987 ◽  
Vol 93 ◽  
Author(s):  
E. L. Fleischer ◽  
J. W. Mayer ◽  
J-P. Hirvonen
Keyword(s):  
Corrosion Resistance ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Pure Titanium ◽  
Ion Beam Mixing ◽  
Amorphous Phases ◽  
Friction Testing ◽  
Transmission Electron ◽  
Wear And Friction

ABSTRACTMulti-layered films of Ti-Au of linearly varying composition were produced by ion irradiation using 600 KeV Ar++ ions. Rutherford Backscattering Spectrometry showed that mixing was complete. The microstructure observed by transmission electron microscopy consisted of a combination of crystalline and amorphous phases at the Ti-rich end and of a crystalline fcc Au solid solution at the Au-rich end. Corrosion testing in a simple immersion cell revealed remarkable corrosion resistance of the ion beam mixed sample compared to that of pure titanium or as-deposited Ti-Au samples (from 100%Au to 60%Ti-40%Au). Wear and friction testing was performed using a reciprocal sliding apparatus with a polytetrafluoroethylene (PTFE) pin. A composition of 60%Ti-40%Au was chosen as optimal for improved corrosion resistance without appreciable degradation in wear and friction properties.

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