Enhancement of Ammonia Sensitivity in Swift Heavy Ion Irradiated NanocrystallineSnO2Thin Films
Swift heavy ion irradiation is an effective technique to induce changes in the microstructure and electronic energy levels of materials leading to significant modification of properties. Here we report enhancement of ammonia (NH3) sensitivity ofSnO2thin films subjected to high-energyNi+ion irradiation. Sol-gel-derivedSnO2thin films (100 nm thickness) were exposed to 75 MeVNi+ion irradiation, and the gas response characteristics of irradiated films were studied as a function of ion fluence. The irradiated films showedp-type conductivity with a much higher response toNH3compared to other gases such as ethanol. The observed enhancement ofNH3sensitivity is discussed in context of ion beam generated electronic states in theSnO2thin films.