scholarly journals Evaluation of damage depth on arginine films with molecular depth profiling by Ar cluster ion beam

2011 ◽  
Vol 36 (3) ◽  
pp. 313-316
Author(s):  
Yasuyuki Yamamoto ◽  
Kazuya Ichiki ◽  
Toshio Seki ◽  
Takaaki Aoki ◽  
Jiro Matsuo
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Molecular Depth Profiling ◽  
Cluster Ion ◽  
Damage Depth

Molecular depth profiling of trehalose using a C60 cluster ion beam

2008 ◽  
Vol 255 (4) ◽  
pp. 959-961 ◽  
Author(s):  
Andreas Wucher ◽  
Juan Cheng ◽  
Nicholas Winograd
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Molecular Depth Profiling ◽  
Cluster Ion

XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam

2016 ◽  
Vol 11 (2) ◽  
pp. 029603 ◽  
Author(s):  
Paul M. Dietrich ◽  
Carolin Nietzold ◽  
Matthias Weise ◽  
Wolfgang E. S. Unger ◽  
Saad Alnabulsi ◽  
...  
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Argon Gas ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

The effect of C60 cluster ion beam bombardment in sputter depth profiling of organic–inorganic hybrid multiple thin films

2008 ◽  
Vol 255 (4) ◽  
pp. 1055-1057 ◽  
Author(s):  
Hyun Kyong Shon ◽  
Tae Geol Lee ◽  
Dahl Hyun Kim ◽  
Hee Jae Kang ◽  
Byoung Hoon Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Depth Profiling ◽  
Inorganic Hybrid ◽  
Cluster Ion

scholarly journals SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam

2010 ◽  
Vol 35 (4) ◽  
pp. 785-788
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Organic Materials ◽  
Ion Beam ◽  
Depth Profiling ◽  
Cluster Ion ◽  
Sims Depth Profiling

The effect of incident energy on molecular depth profiling of polymers with large Ar cluster ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 221-224 ◽  
Author(s):  
Satoshi Ninomiya ◽  
Kazuya Ichiki ◽  
Hideaki Yamada ◽  
Yoshihiko Nakata ◽  
Toshio Seki ◽  
...  
Keyword(s):  
Incident Energy ◽  
Depth Profiling ◽  
Ion Beams ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

Molecular Depth Profiling with Argon Gas Cluster Ion Beams

2015 ◽  
Vol 119 (27) ◽  
pp. 15316-15324 ◽  
Author(s):  
Kan Shen ◽  
Andreas Wucher ◽  
Nicholas Winograd
Keyword(s):  
Depth Profiling ◽  
Ion Beams ◽  
Argon Gas ◽  
Molecular Depth Profiling ◽  
Cluster Ion Beams ◽  
Cluster Ion

XPS depth profiling of organic photodetectors with the gas cluster ion beam

2016 ◽  
Vol 34 (3) ◽  
pp. 03H119 ◽  
Author(s):  
Jakub Haberko ◽  
Mateusz M. Marzec ◽  
Andrzej Bernasik ◽  
Wojciech Łużny ◽  
Pierre Lienhard ◽  
...  
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Organic Photodetectors
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