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XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam
Biointerphases
◽
10.1116/1.4948341
◽
2016
◽
Vol 11
(2)
◽
pp. 029603
◽
Cited By ~ 2
Author(s):
Paul M. Dietrich
◽
Carolin Nietzold
◽
Matthias Weise
◽
Wolfgang E. S. Unger
◽
Saad Alnabulsi
◽
...
Keyword(s):
Ion Beam
◽
Depth Profiling
◽
Argon Gas
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
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Cited By
References
Argon Gas Cluster Ion Beam for Practical Surface Analysis
Journal of the Vacuum Society of Japan
◽
10.3131/jvsj2.59.134
◽
2016
◽
Vol 59
(5)
◽
pp. 134-137
Author(s):
Takuya MIYAYAMA
Keyword(s):
Surface Analysis
◽
Ion Beam
◽
Argon Gas
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry
Journal of the Vacuum Society of Japan
◽
10.3131/jvsj2.56.348
◽
2013
◽
Vol 56
(9)
◽
pp. 348-354
◽
Cited By ~ 2
Author(s):
Takuya MIYAYAMA
Keyword(s):
Mass Spectrometry
◽
Photoelectron Spectroscopy
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Argon Gas
◽
X Ray
◽
Practical Applications
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
Download Full-text
Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis
Bulletin of the Korean Chemical Society
◽
10.1002/bkcs.11840
◽
2019
◽
Vol 40
(9)
◽
pp. 877-881
◽
Cited By ~ 4
Author(s):
Sang Ju Lee
◽
Chang Min Choi
◽
Boo Ki Min
◽
Ji Young Baek
◽
Jae Yeong Eo
◽
...
Keyword(s):
Ion Beam
◽
Argon Gas
◽
Tof Sims
◽
Cluster Ion
◽
Sims Analysis
◽
Gas Cluster Ion Beam
Download Full-text
Argon gas cluster ion beam used to identify intact proteins through enzymatic digestion
Scilight
◽
10.1063/10.0001153
◽
2020
◽
Vol 2020
(16)
◽
pp. 161106
Author(s):
Jodi Ackerman Frank
Keyword(s):
Ion Beam
◽
Enzymatic Digestion
◽
Argon Gas
◽
Intact Proteins
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
XPS depth profiling of organic photodetectors with the gas cluster ion beam
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
◽
10.1116/1.4943028
◽
2016
◽
Vol 34
(3)
◽
pp. 03H119
◽
Cited By ~ 2
Author(s):
Jakub Haberko
◽
Mateusz M. Marzec
◽
Andrzej Bernasik
◽
Wojciech Łużny
◽
Pierre Lienhard
◽
...
Keyword(s):
Ion Beam
◽
Depth Profiling
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Organic Photodetectors
Download Full-text
Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry
Surface and Interface Analysis
◽
10.1002/sia.5518
◽
2014
◽
Vol 46
(12-13)
◽
pp. 1129-1132
Author(s):
Makiko Fujii
◽
Shunichirou Nakagawa
◽
Toshio Seki
◽
Takaaki Aoki
◽
Jiro Matsuo
Keyword(s):
Mass Spectrometry
◽
Quantitative Analysis
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Argon Gas
◽
Ion Mass Spectrometry
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
Download Full-text
Removal of Organic Contamination from Graphene with a Controllable Mass-Selected Argon Gas Cluster Ion Beam
The Journal of Physical Chemistry C
◽
10.1021/acs.jpcc.5b03144
◽
2015
◽
Vol 119
(31)
◽
pp. 17836-17841
◽
Cited By ~ 15
Author(s):
Bonnie J. Tyler
◽
Barry Brennan
◽
Helena Stec
◽
Trupti Patel
◽
Ling Hao
◽
...
Keyword(s):
Ion Beam
◽
Organic Contamination
◽
Argon Gas
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
Chemical stability of polymers under argon gas cluster ion beam and x-ray irradiation
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
◽
10.1116/1.4943951
◽
2016
◽
Vol 34
(3)
◽
pp. 030604
◽
Cited By ~ 5
Author(s):
Andrzej Bernasik
◽
Jakub Haberko
◽
Mateusz M. Marzec
◽
Jakub Rysz
◽
Wojciech Łużny
◽
...
Keyword(s):
Chemical Stability
◽
Ion Beam
◽
Argon Gas
◽
X Ray
◽
Cluster Ion
◽
Gas Cluster Ion Beam
Download Full-text
An electronic structure reinterpretation of the organic semiconductor/electrode interface based on argon gas cluster ion beam sputtering investigations
Journal of Applied Physics
◽
10.1063/1.4812582
◽
2013
◽
Vol 114
(1)
◽
pp. 013703
◽
Cited By ~ 18
Author(s):
Dong-Jin Yun
◽
JaeGwan Chung
◽
Changhoon Jung
◽
Ki-Hong Kim
◽
WoonJoong Baek
◽
...
Keyword(s):
Electronic Structure
◽
Organic Semiconductor
◽
Ion Beam
◽
Ion Beam Sputtering
◽
Argon Gas
◽
Beam Sputtering
◽
Cluster Ion
◽
Electrode Interface
◽
Semiconductor Electrode
◽
Gas Cluster Ion Beam
Download Full-text
Study on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samples
Rapid Communications in Mass Spectrometry
◽
10.1002/rcm.6867
◽
2014
◽
Vol 28
(8)
◽
pp. 917-920
◽
Cited By ~ 10
Author(s):
Makiko Fujii
◽
Shunichirou Nakagawa
◽
Kazuhiro Matsuda
◽
Naoki Man
◽
Toshio Seki
◽
...
Keyword(s):
Mass Spectrometry
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Detection Limits
◽
Argon Gas
◽
Ion Mass Spectrometry
◽
Cluster Ion
◽
Gas Cluster Ion Beam
◽
Secondary Ion
Download Full-text
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