scholarly journals Signal Coding and CMOS Gates for Combinational Functional Blocks of Very Deep Submicron Self-checking Circuits

VLSI Design ◽  
2000 ◽  
Vol 11 (1) ◽  
pp. 23-34 ◽  
Author(s):  
Cecilia Metra ◽  
Michele Favalli ◽  
Bruno Riccò
Keyword(s):  
Deep Submicron ◽  
Transient Faults ◽  
Next Generation ◽  
Electrical Parameters ◽  
Parameter Variations ◽  
Increased Sensitivity ◽  
Functional Blocks ◽  
Internal Faults ◽  
Signal Coding

In this paper we propose signal coding and CMOS gates that are suitable to self-checking circuits with combinational functional blocks implemented also by next generation, very deep submicron technology. In particular, our functional blocks satisfy the Strongly Fault-Secure property with respect to a wide set of possible, internal faults including not only conventional stuck-ats, but also transistor stuck-ons, transistor stuck-opens, resistive bridgings, delays, crosstalks and transient faults, that are very likely to affect next generation ICs. Compared to alternative, existing solutions, that proposed here does not imply any critical constraint on the circuit electrical parameters. Therefore, it is suitable to be adopted to design very deep submicron self-checking circuits which, compared to todays' circuits, will present significantly increased sensitivity to parameter variations occurring during fabrication.

METHODS OF VERIFICATION OF COMPLEX FUNCTIONAL BLOCKS IN CAD FOR CHIPS OF DEEP SUBMICRON DESIGN NORMS

2019 ◽  
Vol 12 (1) ◽  
pp. 16-24 ◽  
Author(s):  
Владимир Зольников ◽  
Vladimir Zolnikov ◽  
Светлана Евдокимова ◽  
Svetlana Evdokimova ◽  
Татьяна Скворцова ◽  
...  
Keyword(s):  
Deep Submicron ◽  
Functional Blocks

Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies

2010 ◽  
Vol 50 (9-11) ◽  
pp. 1241-1246 ◽  
Author(s):  
R.P. Bastos ◽  
G. Sicard ◽  
F. Kastensmidt ◽  
M. Renaudin ◽  
R. Reis
Keyword(s):  
Asynchronous Circuits ◽  
Deep Submicron ◽  
Transient Faults ◽  
Long Duration

scholarly journals Rapid chemiexcitation of phenoxy-dioxetane luminophores yields ultrasensitive chemiluminescence assays

2019 ◽  
Vol 10 (5) ◽  
pp. 1380-1385 ◽  
Author(s):  
Nir Hananya ◽  
Jolene P. Reid ◽  
Ori Green ◽  
Matthew S. Sigman ◽  
Doron Shabat
Keyword(s):  
Rational Design ◽  
Next Generation ◽  
Increased Sensitivity

Rational design of phenoxy-dioxetane luminophores with rapid chemiexcitation is described; these next generation luminophores yielded chemiluminescent probes with considerably increased sensitivity.

scholarly journals Tolerating Permanent Faults in the Input Port of the Network on Chip Router

2019 ◽  
Vol 9 (1) ◽  
pp. 11 ◽  
Author(s):  
Hala Mohammed ◽  
Wameedh Flayyih ◽  
Fakhrul Rokhani
Keyword(s):  
Network Performance ◽  
Deep Submicron ◽  
Network On Chip ◽  
Input Port ◽  
Virtual Channel ◽  
Transient Faults ◽  
Single Chip ◽  
Permanent Faults ◽  
Hardware Redundancy ◽  
On Chip

Deep submicron technologies continue to develop according to Moore’s law allowing hundreds of processing elements and memory modules to be integrated on a single chip forming multi/many-processor systems-on-chip (MPSoCs). Network on chip (NoC) arose as an interconnection for this large number of processing modules. However, the aggressive scaling of transistors makes NoC more vulnerable to both permanent and transient faults. Permanent faults persistently affect the circuit functionality from the time of their occurrence. The router represents the heart of the NoC. Thus, this research focuses on tolerating permanent faults in the router’s input buffer component, particularly the virtual channel state fields. These fields track packets from the moment they enter the input component until they leave to the next router. The hardware redundancy approach is used to tolerate the faults in these fields due to their crucial role in managing the router operation. A built-in self-test logic is integrated into the input port to periodically detect permanent faults without interrupting router operation. These approaches make the NoC router more reliable than the unprotected NoC router with a maximum of 17% and 16% area and power overheads, respectively. In addition, the hardware redundancy approach preserves the network performance in the presence of a single fault by avoiding the virtual channel closure.

scholarly journals Increased sensitivity of next generation sequencing-based expression profiling after globin reduction in human blood RNA

BMC Genomics ◽  
2012 ◽  
Vol 13 (1) ◽  
pp. 28 ◽  
Author(s):  
Anastasios Mastrokolias ◽  
Johan T den Dunnen ◽  
GertJan B van Ommen ◽  
Peter AC 't Hoen ◽  
Willeke MC van Roon-Mom
Keyword(s):  
Next Generation Sequencing ◽  
Human Blood ◽  
Expression Profiling ◽  
Next Generation ◽  
Globin Reduction ◽  
Increased Sensitivity ◽  
Generation Sequencing

scholarly journals Analysis of the Gut Mycobiome in Adult Patients with Type 1 and Type 2 Diabetes Using Next-Generation Sequencing (NGS) with Increased Sensitivity—Pilot Study

Nutrients ◽  
2021 ◽  
Vol 13 (4) ◽  
pp. 1066
Author(s):  
Dominika Salamon ◽  
Agnieszka Sroka-Oleksiak ◽  
Artur Gurgul ◽  
Zbigniew Arent ◽  
Magdalena Szopa ◽  
...  
Keyword(s):  
Next Generation Sequencing ◽  
Total Cholesterol ◽  
Lower Number ◽  
Next Generation ◽  
Group A ◽  
Increased Sensitivity ◽  
Next Generation Sequencing Ngs ◽  
Generation Sequencing

The studies on microbiome in the human digestive tract indicate that fungi could also be one of the external factors affecting development of diabetes. The aim of this study was to evaluate the quantitative and qualitative mycobiome composition in the colon of the adults with type 1 (T1D), n = 26 and type 2 (T2D) diabetes, n = 24 compared to the control group, n = 26. The gut mycobiome was characterized in the stool samples using the analysis of the whole internal transcribed spacer (ITS) region of the fungal rDNA gene cluster by next-generation sequencing (NGS) with increased sensitivity. At the L2 (phylum) level, Basidiomycota fungi were predominant in all 3 study groups. Group T1D presented significantly lower number of Ascomycota compared to the T2D group, and at the L6 (genus) level, the T1D group presented significantly lower number of Saccharomyces genus compared to control and T2D groups. In the T1D group, a significant positive correlation between total cholesterol and low-density lipoprotein cholesterol (LDL-C) levels and fungi of the genus Saccharomyces, and in the T2D group, a negative correlation between the total cholesterol level and Malassezia genus was found. The obtained results seem to be a good foundation to extend the analysis of the relationship between individual genera and species of fungi and the parameters determining the metabolism of carbohydrates and lipids in the human body.

scholarly journals Application of Circuit Modeling in the Study of Spark Formation During Electroerosion Treatment

2021 ◽  
Vol 248 ◽  
pp. 04016
Author(s):  
Artur Porvatov ◽  
Mikhail Kozochkin ◽  
Ilya Minin ◽  
Andrey Maslov ◽  
Vladimir Kuptsov ◽  
...  
Keyword(s):  
Pulse Generator ◽  
Electrical Discharge Machining ◽  
Short Circuit ◽  
Electrical Parameters ◽  
Time Period ◽  
Interelectrode Gap ◽  
Functional Blocks ◽  
The Difference ◽  
Two Parameters ◽  
Edm Process

Electrical discharge machining (EDM) of a workpiece is a complex, fast-flowing process characterized by alternating (intermittent) states: short circuit, idle and spark formation. The discontinuity of the EDM process means that the processing is carried out in single pulses, which are formed by a special pulse generator. The parameters of the generator pulses can be divided into time and electrical. The time period and duration of the pulses, as well as the difference between these two parameters (the “silence” interval), are considered temporary. The electric ones include the amplitude value of the voltage, the maximum permissible current, and the polarity of the pulses. in addition, depending on the device of the generator, the pulses can be composite, for example, have an igniting pulse with a higher voltage and a lower current than the main (working) pulse. In this work, we have developed a interelectrode gap model that allows not only to obtain values of electrical parameters, but also to evaluate and to optimize the electrical parameters of materials being processed with known electrical properties. The key advantage of this model is its modularity, which allows to add new functional blocks, which describe external and internal influences, for example, the concentration of erosion products, uneven electrical conductivity of the workpiece, and others, without changing its structure.

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