2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
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9781457717130

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Technical Program Committee

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.6 ◽

2011 ◽

Keyword(s):

Program Committee ◽

Technical Program Committee ◽

Technical Program

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Analyzing the Sensitivity to Faults of Synchronization Primitives

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.28 ◽

2011 ◽

Author(s):

Paolo Roberto Grassi ◽

Mariagiovanna Sami ◽

Ettore Speziale ◽

Michele Tartara

Keyword(s):

Synchronization Primitives

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NBTI Monitoring and Design for Reliability in Nanoscale Circuits

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.49 ◽

2011 ◽

Cited By ~ 12

Author(s):

Seyab Khan ◽

Nor Zaidi Haron ◽

Said Hamdioui ◽

Francky Catthoor

Keyword(s):

Design For Reliability ◽

Nanoscale Circuits

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Characterizing System-Level Vulnerability for Instruction Caches against Soft Errors

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.30 ◽

2011 ◽

Cited By ~ 3

Author(s):

Shuai Wang

Keyword(s):

Soft Errors ◽

System Level ◽

Instruction Caches

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Deletion/Insertion/Reversal Error Correcting Codes for Bit-Patterned Media Recording

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.36 ◽

2011 ◽

Author(s):

Masato Inoue ◽

Haruhiko Kaneko

Keyword(s):

Error Correcting Codes ◽

Bit Patterned Media ◽

Patterned Media ◽

Reversal Error

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SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.62 ◽

2011 ◽

Cited By ~ 3

Author(s):

Muhammad A. Khan ◽

Hans G. Kerkhoff

Keyword(s):

End Of Life ◽

Mixed Signal

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X-Stacking - A Method for Reducing Control Data for Output Compaction

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.64 ◽

2011 ◽

Cited By ~ 1

Author(s):

Rudrajit Datta ◽

Nur A. Touba

Keyword(s):

Control Data

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Reviewers

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.8 ◽

2011 ◽

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Title Page iii

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.11 ◽

2011 ◽

Keyword(s):

Title Page

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Fine-Grained Software-Based Self-Repair of VLIW Processors

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems ◽

10.1109/dft.2011.43 ◽

2011 ◽

Cited By ~ 10

Author(s):

Mario Schölzel

Keyword(s):

Vliw Processors ◽

Fine Grained ◽

Self Repair

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2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Technical Program Committee

Analyzing the Sensitivity to Faults of Synchronization Primitives

NBTI Monitoring and Design for Reliability in Nanoscale Circuits

Characterizing System-Level Vulnerability for Instruction Caches against Soft Errors

Deletion/Insertion/Reversal Error Correcting Codes for Bit-Patterned Media Recording

SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life

X-Stacking - A Method for Reducing Control Data for Output Compaction

Reviewers

Title Page iii

Fine-Grained Software-Based Self-Repair of VLIW Processors

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Latest Publications