The Role of Wafer Edge in Wafer Bonding Technologies

2020 ◽  
Vol 98 (4) ◽  
pp. 103-114
Author(s):  
Roy Knechtel ◽  
Uwe Schwarz ◽  
Sophia Dempwolf ◽  
Andy Nevin ◽  
Holger Klingner ◽  
...  
Keyword(s):  
2020 ◽  
Vol MA2020-02 (22) ◽  
pp. 1633-1633
Author(s):  
Roy Knechtel ◽  
Uwe Schwarz ◽  
Sophia Dempwolf ◽  
Andy Nevin ◽  
Holger Klingner ◽  
...  
Keyword(s):  

Author(s):  
M.K. Weldon ◽  
Y.J. Chabal ◽  
S.B. Christman ◽  
J. Bourcereau ◽  
C.A. Goodwin ◽  
...  

ChemInform ◽  
2010 ◽  
Vol 29 (31) ◽  
pp. no-no
Author(s):  
C. GUI ◽  
M. ELWENSPOEK ◽  
J. G. E. GARDENIERS ◽  
P. V. LAMBECK

2010 ◽  
Vol 2010 (1) ◽  
pp. 000355-000360
Author(s):  
James Hermanowski ◽  
Greg George

There are numerous process integration schemes currently in place for the implementation of 3D-IC. Via first, via middle, via last along with back end of line (BEOL), front end of line (FEOL) and other variations of these approaches. This work will explore the role of wafer bonding, both permanent and temporary, in the fabrication of 3D-IC. Additionally, the materials and process flows used for these processes will be examined in detail.


2010 ◽  
Vol 13 (6) ◽  
pp. H179 ◽  
Author(s):  
B. Raeissi ◽  
A. Sanz-Velasco ◽  
O. Engström

1991 ◽  
Vol 69 (1) ◽  
pp. 257-260 ◽  
Author(s):  
W. P. Maszara ◽  
B‐L. Jiang ◽  
A. Yamada ◽  
G. A. Rozgonyi ◽  
H. Baumgart ◽  
...  

Author(s):  
Roy Knechtel ◽  
Uwe Schwarz ◽  
Sophia Dempwolf ◽  
Holger Klingner ◽  
Andy Nevin ◽  
...  
Keyword(s):  

2001 ◽  
Vol 79 (21) ◽  
pp. 3413-3415 ◽  
Author(s):  
D. M. Hansen ◽  
C. E. Albaugh ◽  
P. D. Moran ◽  
T. F. Kuech

2009 ◽  
Vol 94 (3) ◽  
pp. 034105 ◽  
Author(s):  
Da-Quan Yu ◽  
Chengkuo Lee ◽  
Li Ling Yan ◽  
Won Kyoung Choi ◽  
Aibin Yu ◽  
...  

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